Eun‐Hee Cirlin
About
In The Last Decade
Eun‐Hee Cirlin
26 papers receiving 449 citations
Peers
Comparison fields: 5 of 37
- Computational Mechanics 342
- Electrical and Electronic Engineering 294
- Materials Chemistry 190
- Mechanics of Materials 94
- Atomic and Molecular Physics, and Optics 73
Countries citing papers authored by Eun‐Hee Cirlin
This map shows the geographic impact of Eun‐Hee Cirlin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Eun‐Hee Cirlin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Eun‐Hee Cirlin more than expected).
Fields of papers citing papers by Eun‐Hee Cirlin
This network shows the impact of papers produced by Eun‐Hee Cirlin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Eun‐Hee Cirlin. The network helps show where Eun‐Hee Cirlin may publish in the future.
Co-authorship network of co-authors of Eun‐Hee Cirlin
This figure shows the co-authorship network connecting the top 25 collaborators of Eun‐Hee Cirlin. A scholar is included among the top collaborators of Eun‐Hee Cirlin based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Eun‐Hee Cirlin. Eun‐Hee Cirlin is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Title | Journal | Authors | Indexed citations |
|---|---|---|---|---|
| 1 | Influence of O+2 energy, flux, and fluence on the formation and growth of sputtering-induced ripple topography on silicon | Journal of Vacuum Science & Technology A Vacuum Surfaces and Films | John J. Vajo, Eun‐Hee Cirlin et al. | 98 |
| 2 | Interlaboratory comparison of the depth resolution in sputter depth profiling of Ni/Cr multilayers with and without sample rotation using AES, XPS, and SIMS | Surface and Interface Analysis | S. Hofmann, A. Zalar et al. | 43 |
| 3 | Auger electron spectroscopy and secondary ion mass spectrometry depth profiling with sample rotation | Thin Solid Films | Eun‐Hee Cirlin | 29 |
| 4 | Ion-induced topography, depth resolution, and ion yield during secondary ion mass spectrometry depth profiling of a GaAs/AlGaAs superlattice: Effects of sample rotation | Journal of Vacuum Science & Technology A Vacuum Surfaces and Films | Eun‐Hee Cirlin, John J. Vajo et al. | 58 |
| 5 | Sample rotation during depth profiling with secondary ion mass spectrometry | Surface and Interface Analysis | John J. Vajo, Eun‐Hee Cirlin | 12 |
| 6 | High resolution secondary ion mass spectrometry depth profiling using continuous sample rotation and its application to superlattice and delta-doped sample analysis | Journal of Vacuum Science & Technology A Vacuum Surfaces and Films | Eun‐Hee Cirlin, John J. Vajo et al. | 26 |
| 7 | Influence of ion mixing on the depth resolution of sputter depth profiling | Journal of Vacuum Science & Technology A Vacuum Surfaces and Films | Yang‐Tse Cheng, B Clemens et al. | 9 |
| 8 | Temperature-independent unassisted pyrolytic MOCVD growth of cadmium telluride at 250°C using 2,5-dihydrotellurophene | Journal of Crystal Growth | J. D. Parsons, Eun‐Hee Cirlin et al. | 17 |
| 9 | Structure of nonrectangular HgCdTe superlattices grown by laser molecular beam epitaxy | Applied Physics Letters | J. T. Cheung, Eun‐Hee Cirlin et al. | 12 |
| 10 | Interdiffusion study of HgTe–HgCdTe superlattice. I. Low‐temperature Auger sputter depth profiling | Journal of Vacuum Science & Technology A Vacuum Surfaces and Films | Eun‐Hee Cirlin, P. J. Ireland et al. | 10 |
| 11 | Low‐temperature Auger depth profile study of HgCdTe double‐layer heterojunction | Journal of Vacuum Science & Technology A Vacuum Surfaces and Films | Eun‐Hee Cirlin, P. J. Ireland et al. | 2 |
| 12 | A Comparison Between High- and Low-Energy Ion Mixing | MRS Proceedings | Yang‐Tse Cheng, Eun‐Hee Cirlin et al. | 4 |
| 13 | Olivine/melt Fe/mg Kd's <0.3: Rapid Cooling of Olivine-Rich Chondrules | Lunar and Planetary Science Conference | L. A. Taylor, Eun‐Hee Cirlin | 3 |
| 14 | THE MARYVILLE METEORITE: A 1983 FALL OF AN L6 CHONDRITE | Meteoritics | John W. Shervais, L. A. Taylor et al. | 3 |
| 15 | Fe/mg KD for Olivine/liquid in Chondrules: Effects of Cooling Rate | LPI | Eun‐Hee Cirlin, L. A. Taylor et al. | 3 |
| 16 | Glass in Chondrules: Effects of Alteration on the Apparent Distribution Coefficient KD of fe and MG at Olivine/glass Interfaces | LPI | Eun‐Hee Cirlin, L. A. Taylor | 1 |
| 17 | Unusual Mineral Assemblages and Textures iun Qingzhen Enstatite Chondrites | Meteoritics and Planetary Science | E. R. Rambaldi, R. M. Housley et al. | 5 |
| 18 | On the alteration of Allende chondrules and the formation of matrix | NASA Technical Reports Server (NASA) | R. M. Housley, Eun‐Hee Cirlin | 40 |
| 19 | Nepheline and Sodalite in Allende Chondrules and Matrix | Meteoritics and Planetary Science | Eun‐Hee Cirlin et al. | 2 |
| 20 | Redistribution of volatiles during lunar metamorphism | Lunar and Planetary Science Conference Proceedings | Eun‐Hee Cirlin, R. M. Housley | 2 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.