Erik Bodegom

628 total citations
34 papers, 412 citations indexed

About

Erik Bodegom is a scholar working on Electrical and Electronic Engineering, Aerospace Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Erik Bodegom has authored 34 papers receiving a total of 412 indexed citations (citations by other indexed papers that have themselves been cited), including 23 papers in Electrical and Electronic Engineering, 19 papers in Aerospace Engineering and 10 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Erik Bodegom's work include CCD and CMOS Imaging Sensors (20 papers), Infrared Target Detection Methodologies (16 papers) and nanoparticles nucleation surface interactions (6 papers). Erik Bodegom is often cited by papers focused on CCD and CMOS Imaging Sensors (20 papers), Infrared Target Detection Methodologies (16 papers) and nanoparticles nucleation surface interactions (6 papers). Erik Bodegom collaborates with scholars based in United States, Romania and Netherlands. Erik Bodegom's co-authors include Ralf Widenhorn, A. Rest, Morley M. Blouke, J. A. Nissen, J. S. Semura, A. Weber, Paul H. E. Meijer, Lars Mündermann, William C. Porter and Mustafa Keskín and has published in prestigious journals such as The Journal of Chemical Physics, Physical review. B, Condensed matter and Journal of Applied Physics.

In The Last Decade

Erik Bodegom

32 papers receiving 384 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Erik Bodegom United States 13 194 120 112 72 56 34 412
Heishun Zen Japan 13 243 1.3× 101 0.8× 250 2.2× 79 1.1× 87 1.6× 150 612
V. G. Veselago Russia 9 118 0.6× 167 1.4× 325 2.9× 53 0.7× 138 2.5× 40 600
Hiroyoshi Tanabe Japan 14 268 1.4× 23 0.2× 76 0.7× 83 1.2× 94 1.7× 81 686
G. N. Kulipanov Russia 11 210 1.1× 74 0.6× 128 1.1× 62 0.9× 69 1.2× 47 405
J. Deschamps France 10 149 0.8× 66 0.6× 134 1.2× 13 0.2× 139 2.5× 33 318
Jérôme Sokoloff France 13 217 1.1× 255 2.1× 489 4.4× 24 0.3× 166 3.0× 60 739
Giovanna Russo Italy 11 55 0.3× 29 0.2× 212 1.9× 199 2.8× 44 0.8× 49 530
Sadhvikas Addamane United States 16 477 2.5× 107 0.9× 427 3.8× 127 1.8× 292 5.2× 88 903
Shahid Aslam United States 10 175 0.9× 32 0.3× 67 0.6× 64 0.9× 87 1.6× 62 409

Countries citing papers authored by Erik Bodegom

Since Specialization
Citations

This map shows the geographic impact of Erik Bodegom's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Erik Bodegom with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Erik Bodegom more than expected).

Fields of papers citing papers by Erik Bodegom

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Erik Bodegom. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Erik Bodegom. The network helps show where Erik Bodegom may publish in the future.

Co-authorship network of co-authors of Erik Bodegom

This figure shows the co-authorship network connecting the top 25 collaborators of Erik Bodegom. A scholar is included among the top collaborators of Erik Bodegom based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Erik Bodegom. Erik Bodegom is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Blouke, Morley M., et al.. (2015). Interpreting Activation Energies in Digital Image Sensors. IEEE Transactions on Electron Devices. 63(1). 26–31. 5 indexed citations
2.
Blouke, Morley M., et al.. (2012). Modeling Nonlinear Dark Current Behavior in CCDs. IEEE Transactions on Electron Devices. 59(4). 1114–1122. 8 indexed citations
3.
Blouke, Morley M., et al.. (2012). Dark current modeling with a moving depletion edge. Journal of Electronic Imaging. 21(4). 43011–43011. 1 indexed citations
4.
Widenhorn, Ralf, et al.. (2010). Exposure Time Dependence of Dark Current in CCD Imagers. IEEE Transactions on Electron Devices. 57(3). 581–587. 17 indexed citations
5.
Bodegom, Erik, et al.. (2010). Characterization and correction of dark current in compact consumer cameras. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7536. 75360J–75360J. 1 indexed citations
6.
Bodegom, Erik, et al.. (2009). Computational Physics Guide2009. PORTO Publications Open Repository TOrino (Politecnico di Torino). 2 indexed citations
7.
Widenhorn, Ralf, et al.. (2009). Dark current behavior in DSLR cameras. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7249. 72490N–72490N. 4 indexed citations
8.
Widenhorn, Ralf, et al.. (2009). Study of the temperature dependence of the dark currents non-uniformity for some video-camera chips. 12. 463–466. 1 indexed citations
9.
Porter, William C., et al.. (2008). Dark current measurements in a CMOS imager. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6816. 68160C–68160C. 28 indexed citations
10.
Widenhorn, Ralf, et al.. (2008). Measurements of dark current in a CCD imager during light exposures. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6816. 68160B–68160B. 6 indexed citations
11.
Widenhorn, Ralf, A. Rest, Morley M. Blouke, Richard L. Berry, & Erik Bodegom. (2007). Computation of dark frames in digital imagers. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6501. 650103–650103. 14 indexed citations
12.
Bodegom, Erik, et al.. (2005). New Meyer-Neldel relations for the depletion and diffusion dark currents in some CCDs. 2. 363–366. 4 indexed citations
13.
Widenhorn, Ralf, et al.. (2005). Infrared response of charge-coupled devices. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5677. 201–201. 5 indexed citations
14.
Bodegom, Erik, et al.. (2005). Interpreting fitting parameters of temperature dependence of dark currents in some CCDs. 2. 327–330. 1 indexed citations
15.
Widenhorn, Ralf, A. Weber, Morley M. Blouke, Albert Bae, & Erik Bodegom. (2003). PSF measurements on back-illuminated CCDs. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5017. 176–176. 2 indexed citations
16.
Widenhorn, Ralf, Morley M. Blouke, A. Weber, A. Rest, & Erik Bodegom. (2002). <title>Temperature dependence of dark current in a CCD</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4669. 193–201. 70 indexed citations
17.
Widenhorn, Ralf, Lars Mündermann, A. Rest, & Erik Bodegom. (2001). Meyer–Neldel rule for dark current in charge-coupled devices. Journal of Applied Physics. 89(12). 8179–8182. 34 indexed citations
18.
Nissen, J. A., et al.. (1992). Diffraction of light by a focused ultrasonic wave. Journal of Applied Physics. 71(1). 70–75. 12 indexed citations
19.
Semura, J. S., et al.. (1988). Homogeneous nucleation temperature of liquidHe3. Physical review. B, Condensed matter. 37(1). 150–154. 16 indexed citations
20.
Bodegom, Erik & Paul H. E. Meijer. (1983). Long term behavior of phase separation; Computations with the non-homogeneous, time dependent cluster variation method. Physica A Statistical Mechanics and its Applications. 122(1-2). 13–36. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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