Elmar Ritter

814 total citations
15 papers, 663 citations indexed

About

Elmar Ritter is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Surfaces, Coatings and Films. According to data from OpenAlex, Elmar Ritter has authored 15 papers receiving a total of 663 indexed citations (citations by other indexed papers that have themselves been cited), including 8 papers in Electrical and Electronic Engineering, 6 papers in Materials Chemistry and 4 papers in Surfaces, Coatings and Films. Recurrent topics in Elmar Ritter's work include Semiconductor materials and devices (5 papers), Catalytic Processes in Materials Science (3 papers) and Optical Coatings and Gratings (3 papers). Elmar Ritter is often cited by papers focused on Semiconductor materials and devices (5 papers), Catalytic Processes in Materials Science (3 papers) and Optical Coatings and Gratings (3 papers). Elmar Ritter collaborates with scholars based in Liechtenstein, United States and Austria. Elmar Ritter's co-authors include H.K. Pulker, G. Paesold, G. Hass, Hubert Selhofer, Michael J. McFarland, W. Heitmann, Klaus Leitner, Richard M. Lambrecht, Robert R. Becker and Alfred P. Wolf and has published in prestigious journals such as Thin Solid Films, European Journal of Wood and Wood Products and Journal of Vacuum Science and Technology.

In The Last Decade

Elmar Ritter

15 papers receiving 608 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Elmar Ritter Liechtenstein	11	368	278	177	165	110	15	663
J. P. Borgogno France	11	339 0.9×	285 1.0×	204 1.2×	305 1.8×	117 1.1×	15	724
P. B. Sewell Canada	15	231 0.6×	441 1.6×	187 1.1×	83 0.5×	146 1.3×	29	730
F. C. Ho Taiwan	11	398 1.1×	273 1.0×	157 0.9×	181 1.1×	149 1.4×	30	673
C. Jardin France	15	332 0.9×	311 1.1×	249 1.4×	127 0.8×	132 1.2×	56	619
Narumi Inoue Japan	17	402 1.1×	358 1.3×	154 0.9×	354 2.1×	127 1.2×	88	874
C. G. Pacey Australia	6	248 0.7×	297 1.1×	70 0.4×	139 0.8×	105 1.0×	9	543
L.J. Hanekamp Netherlands	11	265 0.7×	226 0.8×	62 0.4×	150 0.9×	108 1.0×	21	493
L. Diederich Switzerland	13	327 0.9×	653 2.3×	70 0.4×	108 0.7×	140 1.3×	14	773
J.P. Langeron France	16	279 0.8×	340 1.2×	312 1.8×	123 0.7×	185 1.7×	43	765
E. N. Sickafus United States	14	247 0.7×	151 0.5×	469 2.6×	96 0.6×	278 2.5×	27	758

Countries citing papers authored by Elmar Ritter

Since Specialization

Citations

This map shows the geographic impact of Elmar Ritter's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Elmar Ritter with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Elmar Ritter more than expected).

Fields of papers citing papers by Elmar Ritter

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Elmar Ritter. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Elmar Ritter. The network helps show where Elmar Ritter may publish in the future.

Co-authorship network of co-authors of Elmar Ritter

This figure shows the co-authorship network connecting the top 25 collaborators of Elmar Ritter. A scholar is included among the top collaborators of Elmar Ritter based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Elmar Ritter. Elmar Ritter is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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15 of 15 papers shown

Ritter, Elmar, et al.. (2003). Evaluation of the oxidation of TiO_2 films during reactive evaporation of Ti_3O_5 and during exposure of the films to the atmosphere. Applied Optics. 42(22). 4580–4580. 7 indexed citations

Ritter, Elmar, et al.. (2003). Properties of TiO_x films prepared by electron- beam evaporation of titanium and titanium suboxides. Applied Optics. 42(22). 4590–4590. 18 indexed citations

Selhofer, Hubert, et al.. (2002). Properties of titanium dioxide films prepared by reactive electron-beam evaporation from various starting materials. Applied Optics. 41(4). 756–756. 35 indexed citations

Ritter, Elmar. (1981). Properties of optical film materials. Applied Optics. 20(1). 21–21. 29 indexed citations

Hass, G., et al.. (1977). The effect of the substrate temperature on the optical properties of reactively evaporated silicon oxide films. Thin Solid Films. 42(3). 361–367. 10 indexed citations

Lambrecht, Richard M., Elmar Ritter, Robert R. Becker, & Alfred P. Wolf. (1977). Cyclotron isotopes and radiopharmaceuticals— XXI. Fabrication of 122TeAu targets for isotope production. The International Journal of Applied Radiation and Isotopes. 28(6). 567–571. 1 indexed citations

Ritter, Elmar. (1976). Optical film materials and their applications. Applied Optics. 15(10). 2318–2318. 76 indexed citations

Pulker, H.K., G. Paesold, & Elmar Ritter. (1976). Refractive indices of TiO_2 films produced by reactive evaporation of various titanium–oxygen phases. Applied Optics. 15(12). 2986–2986. 184 indexed citations

Ritter, Elmar, et al.. (1969). Influence of Substrate Temperature on the Condensation of Vacuum Evaporated Films of MgF2 and ZnS. Journal of Vacuum Science and Technology. 6(4). 733–736. 52 indexed citations

10.

Heitmann, W. & Elmar Ritter. (1968). Production and Properties of Vacuum Evaporated Films of Thorium Fluoride. Applied Optics. 7(2). 307–307. 12 indexed citations

11.

Hass, G. & Elmar Ritter. (1967). Optical Film Materials and Their Applications. Journal of Vacuum Science and Technology. 4(2). 71–79. 31 indexed citations

12.

Ritter, Elmar. (1966). Deposition of Oxide Films by Reactive Evaporation. Journal of Vacuum Science and Technology. 3(4). 225–226. 68 indexed citations

13.

Hass, G., et al.. (1965). Effect of Ultraviolet Irradiation on the Optical Properties of Silicon Oxide Films. Applied Optics. 4(8). 971–971. 35 indexed citations

14.

Ritter, Elmar. (1962). Zur Kenntnis der SiO- und Si 2 O 3 -Phase in Dünnen Schichten. Optica Acta International Journal of Optics. 9(2). 197–202. 103 indexed citations

15.

Ritter, Elmar. (1957). Verbundplatten aus Holswerkstoffen mit Kunstschichtstoffoberflüchen. European Journal of Wood and Wood Products. 15(1). 62–67. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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