D.K. Shuh

484 total citations
15 papers, 401 citations indexed

About

D.K. Shuh is a scholar working on Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, D.K. Shuh has authored 15 papers receiving a total of 401 indexed citations (citations by other indexed papers that have themselves been cited), including 8 papers in Surfaces, Coatings and Films, 7 papers in Atomic and Molecular Physics, and Optics and 6 papers in Materials Chemistry. Recurrent topics in D.K. Shuh's work include Electron and X-Ray Spectroscopy Techniques (8 papers), Semiconductor materials and devices (4 papers) and Advanced Chemical Physics Studies (4 papers). D.K. Shuh is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (8 papers), Semiconductor materials and devices (4 papers) and Advanced Chemical Physics Studies (4 papers). D.K. Shuh collaborates with scholars based in United States, Sweden and Belgium. D.K. Shuh's co-authors include J. A. Yarmoff, D. A. Lapiano-Smith, L. J. Terminello, Donald S. Bethune, J. Stöhr, F. J. Himpsel, Gerard Meijer, F. J. Himpsel, V. Chakarian and F. R. McFeely and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

D.K. Shuh

15 papers receiving 391 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
D.K. Shuh United States 9 226 215 96 75 61 15 401
V. М. Mikoushkin Russia 10 139 0.6× 207 1.0× 78 0.8× 51 0.7× 11 0.2× 50 341
Hassan R. Sadeghi United States 7 143 0.6× 340 1.6× 92 1.0× 42 0.6× 10 0.2× 10 490
Yoshinori Hayafuji Japan 12 367 1.6× 255 1.2× 170 1.8× 14 0.2× 23 0.4× 31 538
L. Zommer Poland 12 167 0.7× 165 0.8× 113 1.2× 28 0.4× 12 0.2× 31 372
P. Barone Italy 11 158 0.7× 230 1.1× 98 1.0× 16 0.2× 37 0.6× 40 452
N. Mårtensson Sweden 12 192 0.8× 410 1.9× 161 1.7× 22 0.3× 16 0.3× 20 546
Junji Jia United States 12 66 0.3× 196 0.9× 95 1.0× 16 0.2× 54 0.9× 27 415
K. Raghavachari United States 6 327 1.4× 278 1.3× 142 1.5× 41 0.5× 11 0.2× 9 464
H. Siekmann Germany 12 457 2.0× 500 2.3× 133 1.4× 15 0.2× 34 0.6× 21 678
A. B. Preobrajenski Germany 13 214 0.9× 326 1.5× 132 1.4× 14 0.2× 12 0.2× 19 483

Countries citing papers authored by D.K. Shuh

Since Specialization
Citations

This map shows the geographic impact of D.K. Shuh's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D.K. Shuh with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D.K. Shuh more than expected).

Fields of papers citing papers by D.K. Shuh

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D.K. Shuh. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D.K. Shuh. The network helps show where D.K. Shuh may publish in the future.

Co-authorship network of co-authors of D.K. Shuh

This figure shows the co-authorship network connecting the top 25 collaborators of D.K. Shuh. A scholar is included among the top collaborators of D.K. Shuh based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D.K. Shuh. D.K. Shuh is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

15 of 15 papers shown
1.
Suzuki, Michi‐To, Johan Vegelius, D.K. Shuh, et al.. (2015). 5f -Shell correlation effects in dioxides of light actinides studied by O 1sx-ray absorption and emission spectroscopies and first-principles calculations. Journal of Physics Condensed Matter. 27(31). 315503–315503. 13 indexed citations
2.
Shuh, D.K., et al.. (2010). Comparison of the Behavior of Technetium and Rhenium in Low Activity Waste Glass Formulations Subjected to the Vapor Hydration Test. Microscopy and Microanalysis. 16(S2). 1628–1629. 5 indexed citations
3.
Aïche, M., G. Barreau, B. Jurado, et al.. (2007). Quasi-absolute neutron-induced fission cross section of 243Am. Joint Research Centre (European Commission). 1 indexed citations
4.
McKeown, David A., Andrew C. Buechele, Wayne W. Lukens, D.K. Shuh, & Ian L. Pegg. (2007). Raman studies of technetium in borosilicate waste glass. Radiochimica Acta. 95(5). 275–280. 15 indexed citations
5.
Marasinghe, G. K., M. Karabulut, Chandra S. Ray, et al.. (1999). Vitrified iron phosphate nuclear wasteforms containing multiple waste components. 107. 4 indexed citations
6.
Sutherland, D. G. J., L. J. Terminello, J. A. Carlisle, et al.. (1997). The chemisorption of H2C[Si(CH3)3]2 and Si6(CH3)12 on Si(100) surfaces. Journal of Applied Physics. 82(7). 3567–3571. 5 indexed citations
7.
Sutherland, D. G. J., J. A. Carlisle, Glenn A. Fox, et al.. (1996). Photo-oxidation of electroluminescent polymers studied by core-level photoabsorption spectroscopy. Applied Physics Letters. 68(15). 2046–2048. 86 indexed citations
8.
Simpson, W. C., D.K. Shuh, W. H. Hung, et al.. (1996). Role of surface stoichiometry in the Cl2/GaAs(001) reaction. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 14(3). 1815–1821. 22 indexed citations
9.
Tao, H.-S., Ulrike Diebold, V. Chakarian, et al.. (1995). Radiation-induced decomposition of PF3 on Ru(0001). Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 13(5). 2553–2557. 6 indexed citations
10.
Simpson, W. C., et al.. (1995). Soft x-ray photoelectron spectroscopy study of the reaction of XeF2 with GaAs. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 13(3). 1709–1713. 11 indexed citations
11.
Håkansson, M.C., et al.. (1995). A synchrotron photoemission study of the reaction of iodine with GaAs(001). Vacuum. 46(8-10). 1231–1232. 3 indexed citations
12.
Shuh, D.K., et al.. (1993). XeF2etching of Si(111): The geometric structure of the reaction layer. Physical review. B, Condensed matter. 47(23). 15648–15659. 56 indexed citations
13.
Shuh, D.K., et al.. (1993). Influence of electronic structure on XeF2 etching of silicon. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 11(4). 2054–2058. 11 indexed citations
14.
Yarmoff, J. A., et al.. (1992). Atomic layer epitaxy of silicon by dichlorosilane studied with core level spectroscopy. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 10(4). 2303–2307. 57 indexed citations
15.
Terminello, L. J., D.K. Shuh, F. J. Himpsel, et al.. (1991). Unfilled orbitals of C60 and C70 from carbon K-shell X-ray absorption fine structure. Chemical Physics Letters. 182(5). 491–496. 106 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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