Deepak V. Kulkarni

625 total citations · 1 hit paper
13 papers, 477 citations indexed

About

Deepak V. Kulkarni is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials and Computational Mechanics. According to data from OpenAlex, Deepak V. Kulkarni has authored 13 papers receiving a total of 477 indexed citations (citations by other indexed papers that have themselves been cited), including 5 papers in Electrical and Electronic Engineering, 4 papers in Mechanics of Materials and 3 papers in Computational Mechanics. Recurrent topics in Deepak V. Kulkarni's work include Industrial Vision Systems and Defect Detection (3 papers), Composite Material Mechanics (2 papers) and Surface Modification and Superhydrophobicity (2 papers). Deepak V. Kulkarni is often cited by papers focused on Industrial Vision Systems and Defect Detection (3 papers), Composite Material Mechanics (2 papers) and Surface Modification and Superhydrophobicity (2 papers). Deepak V. Kulkarni collaborates with scholars based in United States, Sweden and India. Deepak V. Kulkarni's co-authors include Takeshi Nakazawa, Daniel A. Tortorelli, Mathias Wallin, G. Villeneuve, Dimitrios Rovas, Ganesh Subbarayan, S. Ponoth, Rui Fang, Xiaoping Liu and Gamal Refai-Ahmed and has published in prestigious journals such as Computer Methods in Applied Mechanics and Engineering, International Journal for Numerical Methods in Engineering and IEEE Transactions on Semiconductor Manufacturing.

In The Last Decade

Deepak V. Kulkarni

11 papers receiving 458 citations

Hit Papers

Wafer Map Defect Pattern Classification and Image Retriev... 2018 2026 2020 2023 2018 50 100 150 200 250
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

  1. Wafer Map Defect Pattern Classification and Image Retrieval Using Convolutional Neural Network
    2018 295 citations Takeshi Nakazawa, Deepak V. Kulkarni IEEE Transactions on Semiconductor Manufacturing profile →

Peers

Deepak V. Kulkarni
Nian Cai China
Su‐Dan Huang China
Xianguo Li China
Seung-Soo Han South Korea
Yunfei Zhou China
Haikuo Shen China
Florian Bugarin France
Zhejun Yuan China
David López-Pérez France
Nian Cai China
Deepak V. Kulkarni
Citations per year, relative to Deepak V. Kulkarni Deepak V. Kulkarni (= 1×) peers Nian Cai

Countries citing papers authored by Deepak V. Kulkarni

Since Specialization
Citations

This map shows the geographic impact of Deepak V. Kulkarni's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Deepak V. Kulkarni with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Deepak V. Kulkarni more than expected).

Fields of papers citing papers by Deepak V. Kulkarni

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Deepak V. Kulkarni. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Deepak V. Kulkarni. The network helps show where Deepak V. Kulkarni may publish in the future.

Co-authorship network of co-authors of Deepak V. Kulkarni

This figure shows the co-authorship network connecting the top 25 collaborators of Deepak V. Kulkarni. A scholar is included among the top collaborators of Deepak V. Kulkarni based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Deepak V. Kulkarni. Deepak V. Kulkarni is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

13 of 13 papers shown
1.
2.
Nakazawa, Takeshi & Deepak V. Kulkarni. (2019). Anomaly Detection and Segmentation for Wafer Defect Patterns Using Deep Convolutional Encoder–Decoder Neural Network Architectures in Semiconductor Manufacturing. IEEE Transactions on Semiconductor Manufacturing. 32(2). 250–256. 118 indexed citations
3.
Nakazawa, Takeshi & Deepak V. Kulkarni. (2018). Wafer Map Defect Pattern Classification and Image Retrieval Using Convolutional Neural Network. IEEE Transactions on Semiconductor Manufacturing. 31(2). 309–314. 295 indexed citations breakdown →
4.
Nakazawa, Takeshi, et al.. (2016). IC Substrate Package Yield Prediction Model and Layer Level Risk Assessment by Design Analysis. IEEE Transactions on Semiconductor Manufacturing. 29(3). 257–262. 4 indexed citations
5.
Kulkarni, Deepak V., et al.. (2012). Ultra-wideband microstrip antenna with dual band-notched characteristics using SRR. 86–89. 4 indexed citations
6.
Kulkarni, Deepak V., et al.. (2007). Analytical Homogenization for Microelectronic Substrates. 397–406.
7.
Kulkarni, Deepak V., et al.. (2007). Application of Scatterometry to BEOL Measurements: Post Cu CMP Measurements. MRS Proceedings. 991. 1 indexed citations
8.
Kulkarni, Deepak V., Daniel A. Tortorelli, & Mathias Wallin. (2006). A Newton–Schur alternative to the consistent tangent approach in computational plasticity. Computer Methods in Applied Mechanics and Engineering. 196(7). 1169–1177. 37 indexed citations
9.
Kulkarni, Deepak V., Dimitrios Rovas, & Daniel A. Tortorelli. (2006). Discontinuous Galerkin framework for adaptive solution of parabolic problems. International Journal for Numerical Methods in Engineering. 70(1). 1–24. 3 indexed citations
10.
Kulkarni, Deepak V., et al.. (2005). Schur's complement approach in computational plasticity. Lund University Publications (Lund University). 1 indexed citations
11.
Kulkarni, Deepak V. & Ganesh Subbarayan. (2003). A dynamic model for predicting the motion solder droplets during assembly. IEEE Transactions on Components and Packaging Technologies. 26(4). 698–704. 1 indexed citations
12.
Villeneuve, G., et al.. (2002). Dynamic finite element analysis simulation of the terminal crimping process. 156–172. 12 indexed citations
13.
Kulkarni, Deepak V. & Ganesh Subbarayan. (2002). A dynamic model for predicting the motion of solder droplets during assembly. 368–376. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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