David Angell

798 total citations
12 papers, 276 citations indexed

About

David Angell is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials and Computational Mechanics. According to data from OpenAlex, David Angell has authored 12 papers receiving a total of 276 indexed citations (citations by other indexed papers that have themselves been cited), including 10 papers in Electrical and Electronic Engineering, 2 papers in Mechanics of Materials and 2 papers in Computational Mechanics. Recurrent topics in David Angell's work include Semiconductor materials and devices (4 papers), Plasma Diagnostics and Applications (3 papers) and Ion-surface interactions and analysis (2 papers). David Angell is often cited by papers focused on Semiconductor materials and devices (4 papers), Plasma Diagnostics and Applications (3 papers) and Ion-surface interactions and analysis (2 papers). David Angell collaborates with scholars based in United States and United Kingdom. David Angell's co-authors include T. Dickinson, G. S. Oehrlein, Reza Shadmehr, Paul B. Chou, N. Cue, R. Greef, J. W. Corbett, Jeffrey T. Borenstein, Jae-Sung Rieh and B. Jagannathan and has published in prestigious journals such as Applied Physics Letters, Journal of The Electrochemical Society and Electrochimica Acta.

In The Last Decade

David Angell

12 papers receiving 258 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
David Angell United States	6	191	123	53	35	30	12	276
R. Swaminathan India	11	105 0.5×	50 0.4×	20 0.4×	73 2.1×	18 0.6×	37	284
H. V. Venkatasetty United States	9	152 0.8×	26 0.2×	17 0.3×	16 0.5×	23 0.8×	27	293
M.F. Dautartas United States	12	271 1.4×	150 1.2×	120 2.3×	50 1.4×	127 4.2×	18	373
Michael D. Bronshtein Russia	11	219 1.1×	206 1.7×	13 0.2×	34 1.0×	22 0.7×	22	412
Hao Yin China	13	199 1.0×	61 0.5×	26 0.5×	67 1.9×	57 1.9×	29	394
Lev Logunov Russia	11	144 0.8×	58 0.5×	34 0.6×	146 4.2×	11 0.4×	37	300
Shota Iizuka Japan	10	260 1.4×	82 0.7×	48 0.9×	21 0.6×	7 0.2×	33	358
Kaan Keçeci Türkiye	12	94 0.5×	73 0.6×	39 0.7×	275 7.9×	27 0.9×	22	435
Dale Hall United States	11	349 1.8×	139 1.1×	39 0.7×	8 0.2×	48 1.6×	19	489
B. Álvarez Spain	10	186 1.0×	172 1.4×	12 0.2×	72 2.1×	12 0.4×	10	389

Countries citing papers authored by David Angell

Since Specialization

Citations

This map shows the geographic impact of David Angell's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by David Angell with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites David Angell more than expected).

Fields of papers citing papers by David Angell

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by David Angell. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by David Angell. The network helps show where David Angell may publish in the future.

Co-authorship network of co-authors of David Angell

This figure shows the co-authorship network connecting the top 25 collaborators of David Angell. A scholar is included among the top collaborators of David Angell based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with David Angell. David Angell is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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12 of 12 papers shown

Angell, David, et al.. (2007). Input Source Error Concerns for Protective Relays. 63–70. 12 indexed citations

Ahlgren, D., B. Jagannathan, S.J. Jeng, et al.. (2003). Process variability analysis of a Si/SiGe HBT technology with greater than 200 GHz performance. 80–83. 9 indexed citations

Ramsey, David A., et al.. (2002). Automated defect, inclusion and morphological analysis of Solarex polycrystalline silicon. 726–730. 1 indexed citations

Shadmehr, Reza, et al.. (1992). Principal Component Analysis of Optical Emission Spectroscopy and Mass Spectrometry: Application to Reactive Ion Etch Process Parameter Estimation Using Neural Networks. Journal of The Electrochemical Society. 139(3). 907–914. 43 indexed citations

Angell, David & G. S. Oehrlein. (1991). <title>Etch tailoring through flexible end-point detection</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1392. 543–550. 1 indexed citations

Angell, David & G. S. Oehrlein. (1991). Grazing angle optical emission interferometry for end-point detection. Applied Physics Letters. 58(3). 240–242. 4 indexed citations

Oehrlein, G. S., et al.. (1990). Cryogenic reactive ion etching of silicon in SF6. Applied Physics Letters. 57(5). 431–433. 25 indexed citations

Angell, David, et al.. (1989). Charge collection ion microscopy: Imaging of defects in semiconductors with a positive ion microbeam. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 44(2). 172–178. 23 indexed citations

Oehrlein, G. S., et al.. (1989). Study of oxygen addition to CF3Br reactive ion etching plasmas: Effects on silicon surface chemistry and etching behavior. Applied Physics Letters. 54(23). 2321–2323. 1 indexed citations

10.

Borenstein, Jeffrey T., David Angell, & J. W. Corbett. (1988). Inflimne of Dopant type and Conceintrtion on Hydrogen Diffusion in Silicon. MRS Proceedings. 138. 5 indexed citations

11.

Angell, David & T. Dickinson. (1972). The kinetics of the ferrous/ferric and ferro/ferricyanide reactions at platinum and gold electrodes. Journal of Electroanalytical Chemistry. 35(1). 55–72. 147 indexed citations

12.

Angell, David, T. Dickinson, & R. Greef. (1968). The potential distribution near a rotating-disk electrode. Electrochimica Acta. 13(1). 120–123. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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