David A. Zatko
- Materials Chemistry top 10%
- Electrical and Electronic Engineering
- Organic Chemistry top 10%
- Oncology
- Electronic, Optical and Magnetic Materials
- Co-authors
- C. D. WagnerR. RaymondByron KratochvilRobert K. BoggessR. MarkuszewskiJohn W. PratherJerry L. Atwood
- Topics
- Inorganic and Organometallic Chemistry (5 papers)Electrochemical Analysis and Applications (5 papers)Metal complexes synthesis and properties (3 papers)
- Journals
- Analytical ChemistryInorganic ChemistryJournal of Electron Spectroscopy and Related Phenomena
- Partner nations
- United States
In The Last Decade
David A. Zatko
14 papers receiving 757 citations
Hit Papers
Peers
Comparison fields: 5 of 74
- Materials Chemistry 402
- Electrical and Electronic Engineering 222
- Organic Chemistry 160
- Oncology 105
- Electronic, Optical and Magnetic Materials 99
Countries citing papers authored by David A. Zatko
This map shows the geographic impact of David A. Zatko's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by David A. Zatko with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites David A. Zatko more than expected).
Fields of papers citing papers by David A. Zatko
This network shows the impact of papers produced by David A. Zatko. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by David A. Zatko. The network helps show where David A. Zatko may publish in the future.
Co-authorship network of co-authors of David A. Zatko
This figure shows the co-authorship network connecting the top 25 collaborators of David A. Zatko. A scholar is included among the top collaborators of David A. Zatko based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with David A. Zatko. David A. Zatko is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | Use of the oxygen KLL Auger lines in identification of surface chemical states by electron spectroscopy for chemical analysisbreakdown → | 535 |
| 2 | 10 | |
| 3 | 15 | |
| 4 | 2 | |
| 5 | 21 | |
| 6 | 59 | |
| 7 | 21 | |
| 8 | 19 | |
| 9 | 1 | |
| 10 | 22 | |
| 11 | 31 | |
| 12 | 68 | |
| 13 | 15 | |
| 14 | 9 |
About David A. Zatko
David A. Zatko is a scholar working on Electrochemistry, Filtration and Separation and Surfaces, Coatings and Films, having authored 14 papers that have together received 828 indexed citations. Recurring topics across this work include Inorganic and Organometallic Chemistry (5 papers), Electrochemical Analysis and Applications (5 papers) and Metal complexes synthesis and properties (3 papers). The work is most often cited by research in Electrochemistry (81 citations), Surfaces, Coatings and Films (76 citations) and Materials Chemistry (402 citations). David A. Zatko has collaborated with scholars based in United States. Frequent co-authors include C. D. Wagner, R. Raymond, Byron Kratochvil, Robert K. Boggess, R. Markuszewski, John W. Prather and Jerry L. Atwood. Their work appears in journals such as Analytical Chemistry, Inorganic Chemistry and Journal of Electron Spectroscopy and Related Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.