Daniel Wack

556 total citations
17 papers, 464 citations indexed

About

Daniel Wack is a scholar working on Electrical and Electronic Engineering, Radiation and Surfaces, Coatings and Films. According to data from OpenAlex, Daniel Wack has authored 17 papers receiving a total of 464 indexed citations (citations by other indexed papers that have themselves been cited), including 7 papers in Electrical and Electronic Engineering, 5 papers in Radiation and 5 papers in Surfaces, Coatings and Films. Recurrent topics in Daniel Wack's work include Advancements in Photolithography Techniques (4 papers), Medical Imaging Techniques and Applications (4 papers) and Radiation Detection and Scintillator Technologies (4 papers). Daniel Wack is often cited by papers focused on Advancements in Photolithography Techniques (4 papers), Medical Imaging Techniques and Applications (4 papers) and Radiation Detection and Scintillator Technologies (4 papers). Daniel Wack collaborates with scholars based in United States. Daniel Wack's co-authors include Watt W. Webb, B. W. Batterman, H. Dosch, Kenneth E. Goodson, Elah Bozorg-Grayeli, Zijian Li, Matthew A. Panzer, Mehdi Asheghi, A. Pokrovsky and Takashi Kodama and has published in prestigious journals such as Physical Review Letters, Nano Letters and Applied Physics Letters.

In The Last Decade

Daniel Wack

14 papers receiving 446 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Daniel Wack United States 9 173 156 147 110 61 17 464
C. V. Dharmadhikari India 13 263 1.5× 184 1.2× 133 0.9× 191 1.7× 20 0.3× 49 598
V. M. Zhilin Russia 14 224 1.3× 257 1.6× 59 0.4× 238 2.2× 46 0.8× 45 605
Matthew L. Trawick United States 11 186 1.1× 125 0.8× 34 0.2× 132 1.2× 41 0.7× 26 439
Hung‐Chih Kan Taiwan 16 282 1.6× 171 1.1× 76 0.5× 280 2.5× 19 0.3× 57 736
E. F. Venger Ukraine 13 198 1.1× 157 1.0× 27 0.2× 191 1.7× 11 0.2× 61 440
T. G. RICHMOND Switzerland 10 164 0.9× 200 1.3× 18 0.1× 162 1.5× 49 0.8× 20 409
Takeo Sasaki Japan 13 230 1.3× 93 0.6× 32 0.2× 224 2.0× 87 1.4× 37 699
Ch. Adessi France 15 601 3.5× 255 1.6× 78 0.5× 438 4.0× 32 0.5× 27 960
M. S. Leung United States 16 242 1.4× 206 1.3× 13 0.1× 283 2.6× 49 0.8× 62 653
A. Cossy-Favre Switzerland 7 196 1.1× 145 0.9× 18 0.1× 80 0.7× 45 0.7× 20 415

Countries citing papers authored by Daniel Wack

Since Specialization
Citations

This map shows the geographic impact of Daniel Wack's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Daniel Wack with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Daniel Wack more than expected).

Fields of papers citing papers by Daniel Wack

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Daniel Wack. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Daniel Wack. The network helps show where Daniel Wack may publish in the future.

Co-authorship network of co-authors of Daniel Wack

This figure shows the co-authorship network connecting the top 25 collaborators of Daniel Wack. A scholar is included among the top collaborators of Daniel Wack based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Daniel Wack. Daniel Wack is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

17 of 17 papers shown
1.
Juschkin, Larissa & Daniel Wack. (2022). Source performance metrics for EUV mask inspection. Journal of Micro/Nanopatterning Materials and Metrology. 21(2). 2 indexed citations
2.
Bozorg-Grayeli, Elah, Zijian Li, Mehdi Asheghi, et al.. (2012). Thermal conduction properties of Mo/Si multilayers for extreme ultraviolet optics. Journal of Applied Physics. 112(8). 18 indexed citations
3.
Li, Zijian, Elah Bozorg-Grayeli, Takashi Kodama, et al.. (2012). Phonon Dominated Heat Conduction Normal to Mo/Si Multilayers with Period below 10 nm. Nano Letters. 12(6). 3121–3126. 57 indexed citations
4.
Bozorg-Grayeli, Elah, Zijian Li, Mehdi Asheghi, et al.. (2011). High temperature thermal properties of thin tantalum nitride films. Applied Physics Letters. 99(26). 38 indexed citations
5.
Wack, Daniel, et al.. (2010). Mask inspection technologies for 22nm HP and beyond. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7636. 76360V–76360V. 1 indexed citations
6.
Wack, Daniel, et al.. (2010). EUV mask inspection with 193 nm inspector for 32 and 22 nm HP. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7748. 77481Y–77481Y. 6 indexed citations
7.
Spielman, Steven, et al.. (2009). Dark-field optical scatterometry for line-width-roughness metrology. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7272. 72720L–72720L. 3 indexed citations
8.
Hamel, Sébastien, Andrew Williamson, Hugh F. Wilson, et al.. (2008). First-principles calculations of the dielectric properties of silicon nanostructures. Applied Physics Letters. 92(4). 19 indexed citations
9.
Wack, Daniel, et al.. (2008). Opportunities and challenges for optical CD metrology in double patterning process control. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6922. 69221N–69221N. 2 indexed citations
10.
McDaniel, David L., Brian Johnston, Daniel Wack, & John Williams. (2005). Simulation and measurement of spatial resolution in detection of annihilation radiation with BGO crystals. 34. 1739–1743.
11.
12.
Stearns, C.W. & Daniel Wack. (2002). A noise equivalent counts approach to transmission imaging and source design. Conference Record of the 1991 IEEE Nuclear Science Symposium and Medical Imaging Conference. 1593–1597. 1 indexed citations
13.
Stearns, C.W. & Daniel Wack. (1993). A noise equivalent counts approach to transmission imaging and source design. IEEE Transactions on Medical Imaging. 12(2). 287–292. 8 indexed citations
14.
Wack, Daniel & Watt W. Webb. (1989). Synchrotron x-ray study of the modulated lamellar phasePβin the lecithin-water system. Physical review. A, General physics. 40(5). 2712–2730. 101 indexed citations
15.
Wack, Daniel & Watt W. Webb. (1989). Measurement by x-ray diffraction methods of the layer compressional elastic constantBin the lyotropic smectic-A(Lα) phase of the lecithin-water system. Physical review. A, General physics. 40(3). 1627–1636. 19 indexed citations
16.
Wack, Daniel & Watt W. Webb. (1988). Measurements of Modulated LamellarPβPhases of Interacting Lipid Membranes. Physical Review Letters. 61(10). 1210–1213. 40 indexed citations
17.
Dosch, H., B. W. Batterman, & Daniel Wack. (1986). Depth-Controlled Grazing-Incidence Diffraction of Synchrotron X Radiation. Physical Review Letters. 56(11). 1144–1147. 149 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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