D. L. Malm

624 total citations
25 papers, 475 citations indexed

About

D. L. Malm is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Computational Mechanics. According to data from OpenAlex, D. L. Malm has authored 25 papers receiving a total of 475 indexed citations (citations by other indexed papers that have themselves been cited), including 13 papers in Electrical and Electronic Engineering, 11 papers in Materials Chemistry and 7 papers in Computational Mechanics. Recurrent topics in D. L. Malm's work include Ion-surface interactions and analysis (6 papers), Semiconductor materials and devices (6 papers) and Semiconductor materials and interfaces (5 papers). D. L. Malm is often cited by papers focused on Ion-surface interactions and analysis (6 papers), Semiconductor materials and devices (6 papers) and Semiconductor materials and interfaces (5 papers). D. L. Malm collaborates with scholars based in United States and Germany. D. L. Malm's co-authors include J. P. Franey, T. E. Graedel, G. J. Gualtieri, G. W. Kammlott, R. P. Frankenthal, M. J. Vasile, Adam Heller, B. Miller, D. E. Aspnes and L. A. Heimbrook and has published in prestigious journals such as Journal of the American Chemical Society, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

D. L. Malm

22 papers receiving 430 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
D. L. Malm United States 10 229 223 118 68 61 25 475
P. Willich Germany 15 260 1.1× 252 1.1× 137 1.2× 64 0.9× 50 0.8× 41 556
Minoru Nonoyama Japan 8 102 0.4× 188 0.8× 119 1.0× 87 1.3× 55 0.9× 10 490
Sven Erik Hörnström Sweden 16 225 1.0× 302 1.4× 142 1.2× 42 0.6× 22 0.4× 28 524
P.E. Viljoen South Africa 13 126 0.6× 219 1.0× 102 0.9× 47 0.7× 27 0.4× 31 396
T. Strauss France 12 277 1.2× 288 1.3× 67 0.6× 77 1.1× 111 1.8× 29 627
P. B. Sewell Canada 15 231 1.0× 441 2.0× 146 1.2× 88 1.3× 83 1.4× 29 730
John W. DeFord United States 9 152 0.7× 282 1.3× 70 0.6× 26 0.4× 34 0.6× 13 440
E. N. Farabaugh United States 12 212 0.9× 477 2.1× 104 0.9× 80 1.2× 116 1.9× 27 609
M.P. Delplancke Belgium 11 249 1.1× 376 1.7× 59 0.5× 50 0.7× 58 1.0× 19 547
C.B. Carter United States 12 107 0.5× 210 0.9× 146 1.2× 40 0.6× 38 0.6× 32 380

Countries citing papers authored by D. L. Malm

Since Specialization
Citations

This map shows the geographic impact of D. L. Malm's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. L. Malm with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. L. Malm more than expected).

Fields of papers citing papers by D. L. Malm

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. L. Malm. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. L. Malm. The network helps show where D. L. Malm may publish in the future.

Co-authorship network of co-authors of D. L. Malm

This figure shows the co-authorship network connecting the top 25 collaborators of D. L. Malm. A scholar is included among the top collaborators of D. L. Malm based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D. L. Malm. D. L. Malm is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Sheng, T. T., et al.. (1990). Shallow junctions by out-diffusion from BF2 implanted polycrystalline silicon. Journal of Applied Physics. 68(7). 3707–3713. 3 indexed citations
2.
Chiu, T. H., J. E. Cunningham, A. Robertson, & D. L. Malm. (1990). Atomic layer epitaxy of GaAs by chemical beam epitaxy. Journal of Crystal Growth. 105(1-4). 155–161. 21 indexed citations
3.
Lum, R. M., J. K. Klingert, D. W. Kisker, et al.. (1988). Investigation of carbon incorporation in GaAs using13C-enriched trimethylarsenic and13Ch4. Journal of Electronic Materials. 17(2). 101–104. 59 indexed citations
4.
Pearton, S. J., D. L. Malm, L. A. Heimbrook, et al.. (1987). Heterointerface stability in GaAs-on-Si grown by metalorganic chemical vapor deposition. Applied Physics Letters. 51(9). 682–684. 21 indexed citations
5.
Franey, J. P., T. E. Graedel, G. J. Gualtieri, et al.. (1984). Conductive silver-epoxy pastes: characteristics of alternative formulations. Journal of Materials Science. 19(10). 3281–3286. 4 indexed citations
6.
Malm, D. L., et al.. (1982). Characterization of Near Surface Composition of Borosilicate Glasses (BSG) by Secondary Ion Mass Spectrometry (SIMS). Journal of The Electrochemical Society. 129(8). 1819–1821. 6 indexed citations
7.
Lewerenz, H. J., D. E. Aspnes, B. Miller, D. L. Malm, & Adam Heller. (1982). Semiconductor interface characterization in photoelectrochemical solar cells: the p-indium phosphide (111)A face. Journal of the American Chemical Society. 104(12). 3325–3329. 52 indexed citations
8.
Franey, J. P., T. E. Graedel, G. J. Gualtieri, et al.. (1981). The morphology and corrosion resistance of a conductive silver-epoxy paste. Journal of Materials Science. 16(9). 2360–2368. 4 indexed citations
9.
Strehblow, Hans‐Henning & D. L. Malm. (1979). Characterization of anodized aluminium—Copper vapour-deposited films by ion scattering spectrometry. Corrosion Science. 19(7). 469–473. 9 indexed citations
10.
Malm, D. L., M. J. Vasile, F. J. Padden, D. B. Dove, & C. G. Pantano. (1978). Depth profiles of sodium and calcium in glasses: A comparison of secondary ion mass analysis and Auger spectrometry. Journal of Vacuum Science and Technology. 15(1). 35–38. 18 indexed citations
11.
Frankenthal, R. P. & D. L. Malm. (1976). Analysis of the Air‐Formed Oxide Film on a Series of Iron‐Chromium Alloys by Ion‐Scattering Spectrometry. Journal of The Electrochemical Society. 123(2). 186–191. 57 indexed citations
12.
Vasile, M. J. & D. L. Malm. (1976). Simultaneous ion-scattering and secondary-ion mass spectrometry. International Journal of Mass Spectrometry and Ion Physics. 21(1-2). 145–157. 5 indexed citations
13.
Bachmann, K. J., Lorna Clark, E. Buehler, D. L. Malm, & J. L. Shay. (1975). Zone melting of indium phosphide. Journal of Electronic Materials. 4(4). 741–756. 5 indexed citations
14.
Vasile, M. J. & D. L. Malm. (1972). Study of electroplated gold by spark source mass spectrometry. Analytical Chemistry. 44(4). 650–655. 4 indexed citations
15.
Rubin, J. J., D. L. Malm, & K. J. Bachmann. (1972). Electron beam float zone growth of niobium-tantalum alloy crystals. Materials Research Bulletin. 7(6). 597–602. 3 indexed citations
16.
Menth, A., A. R. Von Neida, L. K. Shick, & D. L. Malm. (1972). Magnetic properties of Cu-doped ZnCr2Se4. Journal of Physics and Chemistry of Solids. 33(6). 1338–1341. 16 indexed citations
17.
Malm, D. L.. (1968). Mass Spectrographic Technique for the Determination of Molybdenum Additive in Tantalum Oxide Capacitor Films. Applied Spectroscopy. 22(4). 318–320. 1 indexed citations
18.
Ahearn, A. J., F. A. Trumbore, C. J. Frosch, C. L. Luke, & D. L. Malm. (1967). Spark source mass spectrometric measurements of dopants of known concentrations in gallium phosphide. Analytical Chemistry. 39(3). 350–352. 9 indexed citations
19.
Ahearn, A. J. & D. L. Malm. (1966). Background Reduction in Photographs of Mass Spectra. Applied Spectroscopy. 20(6). 411–412. 1 indexed citations
20.
Salovey, R., D. L. Malm, A. L. Beach, & J. P. Luongo. (1964). Irradiation of polyethylene crystals: Gas evolution studies. Journal of Polymer Science Part A General Papers. 2(7). 3067–3074. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by P. Willich Breakdown of academic impact, for papers by Minoru Nonoyama Breakdown of academic impact, for papers by Sven Erik Hörnström Breakdown of academic impact, for papers by P.E. Viljoen Breakdown of academic impact, for papers by T. Strauss Breakdown of academic impact, for papers by P. B. Sewell Breakdown of academic impact, for papers by John W. DeFord Breakdown of academic impact, for papers by E. N. Farabaugh Breakdown of academic impact, for papers by M.P. Delplancke Breakdown of academic impact, for papers by C.B. Carter
Rankless by CCL
2026