C.S. Hong

471 citations
34 papers · 331 indexed · h-index 11

C.S. Hong

31 papers receiving 302 citations

Peers

C.S. Hong
Comparison fields: 5 of 26
  • Atomic and Molecular Physics, and Optics 237
  • Surfaces, Coatings and Films 39
  • Electrical and Electronic Engineering 301
  • Instrumentation 13
  • Spectroscopy 29
Replace M. G. Harvey with:
M. G. Harvey United States
M. Seki Japan
I.F. Lealman United Kingdom
L. Curtis United States
J. Geske United States
D. Carothers United States
Bocang Qiu China
Christian Neumeyr Germany
Yuliya Akulova United States
M.C. Brain United Kingdom
C.S. Hong relative to M. G. Harvey United States M. G. Harvey's profile →
Citations per field
00.5×4.5×
M. G. Harvey · 1×
Citations per year

Countries citing papers authored by C.S. Hong

Since Specialization
Citations

This map shows the geographic impact of C.S. Hong's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C.S. Hong with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C.S. Hong more than expected).

Fields of papers citing papers by C.S. Hong

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C.S. Hong. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C.S. Hong. The network helps show where C.S. Hong may publish in the future.

Co-authorship network

The 25 scholars most cited alongside C.S. Hong, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with C.S. Hong Line = papers co-authored together C.S. Hong links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20151
2 200210
3 19932
4 19925
5 199218
6 19922
7 19929
8
High power high temperature InGaAs strained quantum well lasers
19911
9 199111
10 199113
11 199135
12 19904
13 19904
14 198415
15 19834
16 19831
17 19821
18 19787
19 197712
20 197728

About C.S. Hong

C.S. Hong is a scholar working on Instrumentation, Atomic and Molecular Physics, and Optics and Electrical and Electronic Engineering, having authored 34 papers that have together received 331 indexed citations. Recurring topics across this work include Semiconductor Lasers and Optical Devices (27 papers), Semiconductor Quantum Structures and Devices (21 papers), Photonic and Optical Devices (14 papers), Spectroscopy and Laser Applications (7 papers), Photorefractive and Nonlinear Optics (3 papers), Advanced Optical Sensing Technologies (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers) and Engineering and Test Systems (3 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (237 citations), Surfaces, Coatings and Films (39 citations) and Electrical and Electronic Engineering (301 citations). C.S. Hong has collaborated with scholars based in United States, Australia and Brazil. Frequent co-authors include A. Yariv, Abraham Katzir, Eric Y. Chan, D. Kasemset, L. Figueroa, Navin B. Patel, P.D. Dapkus, R.A. Milano, Harold E. Hager and Joachim Merz. Their work appears in journals such as Applied Physics Letters, IEEE Photonics Technology Letters, Electronics Letters, IEEE Journal of Quantum Electronics and IEEE Transactions on Electron Devices.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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