C.R. Viswanathan

2.0k total citations
118 papers, 1.5k citations indexed

About

C.R. Viswanathan is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, C.R. Viswanathan has authored 118 papers receiving a total of 1.5k indexed citations (citations by other indexed papers that have themselves been cited), including 107 papers in Electrical and Electronic Engineering, 22 papers in Atomic and Molecular Physics, and Optics and 7 papers in Materials Chemistry. Recurrent topics in C.R. Viswanathan's work include Semiconductor materials and devices (95 papers), Advancements in Semiconductor Devices and Circuit Design (79 papers) and Integrated Circuits and Semiconductor Failure Analysis (34 papers). C.R. Viswanathan is often cited by papers focused on Semiconductor materials and devices (95 papers), Advancements in Semiconductor Devices and Circuit Design (79 papers) and Integrated Circuits and Semiconductor Failure Analysis (34 papers). C.R. Viswanathan collaborates with scholars based in United States, India and Russia. C.R. Viswanathan's co-authors include A.A. Abidi, Tomasz Brożek, Timothy J. Tredwell, L. O. Bubulac, V. Ramgopal Rao, R. Li, Alexander A. Balandin, John Langan, Shiwei Cai and J. Maserjian and has published in prestigious journals such as The Journal of Chemical Physics, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

C.R. Viswanathan

109 papers receiving 1.3k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
C.R. Viswanathan United States	21	1.2k	406	226	181	129	118	1.5k
Linus A. Fetter United States	14	824 0.7×	630 1.6×	133 0.6×	187 1.0×	118 0.9×	46	1.2k
S. Makram–Ebeid France	13	696 0.6×	451 1.1×	167 0.7×	88 0.5×	47 0.4×	30	860
G. E. Stillman United States	26	1.7k 1.4×	1.5k 3.8×	237 1.0×	201 1.1×	183 1.4×	79	2.1k
J. M. Ballantyne United States	21	1.1k 0.9×	970 2.4×	274 1.2×	88 0.5×	243 1.9×	88	1.5k
E.C. Larkins United Kingdom	18	1.2k 1.0×	1.1k 2.6×	130 0.6×	243 1.3×	141 1.1×	149	1.4k
A. A. Grinberg United States	13	619 0.5×	636 1.6×	187 0.8×	107 0.6×	79 0.6×	46	937
J. Caro Netherlands	17	816 0.7×	943 2.3×	201 0.9×	122 0.7×	225 1.7×	69	1.3k
J. M. Ballingall United States	23	1.6k 1.3×	1.2k 3.0×	289 1.3×	225 1.2×	119 0.9×	85	1.8k
A. R. Beattie United Kingdom	12	972 0.8×	825 2.0×	252 1.1×	66 0.4×	75 0.6×	28	1.2k
P. Ballet France	20	821 0.7×	625 1.5×	344 1.5×	95 0.5×	118 0.9×	82	1.0k

Countries citing papers authored by C.R. Viswanathan

Since Specialization

Citations

This map shows the geographic impact of C.R. Viswanathan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C.R. Viswanathan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C.R. Viswanathan more than expected).

Fields of papers citing papers by C.R. Viswanathan

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C.R. Viswanathan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C.R. Viswanathan. The network helps show where C.R. Viswanathan may publish in the future.

Co-authorship network of co-authors of C.R. Viswanathan

This figure shows the co-authorship network connecting the top 25 collaborators of C.R. Viswanathan. A scholar is included among the top collaborators of C.R. Viswanathan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C.R. Viswanathan. C.R. Viswanathan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Viswanathan, C.R., et al.. (2005). Role of Test Stress Levels in Detection of Process-Induced Latent Charging Damage in MOS Transistors. 81–83.

Brożek, Tomasz, Y.D. Chan, & C.R. Viswanathan. (2005). Threshold voltage degradation in plasma damaged cmos transistors - role of electron and hole traps related to charging damage. 1627–1630. 2 indexed citations

Viswanathan, C.R., et al.. (2004). ON THE ELECTRICAL CHARACTERISTICS OF VACUUM EVAPORATED INDIUM SELENIDE THIN FILMS. 3 indexed citations

Grupen, Matt & C.R. Viswanathan. (2003). A numerical simulation of the transient drain current in a MOST at cryogenic temperatures. 63–67. 1 indexed citations

Viswanathan, C.R.. (1999). Plasma-induced damage. Microelectronic Engineering. 49(1-2). 65–81. 14 indexed citations

Brożek, Tomasz, et al.. (1997). Polarity dependence of cumulative properties of charge-to-breakdown in very thin gate oxides. Solid-State Electronics. 41(7). 995–999. 5 indexed citations

Brożek, Tomasz, Y.D. Chan, & C.R. Viswanathan. (1996). Enhanced Hole Trapping in MOS Devices Damaged by Plasma-Induced Charging. European Solid-State Device Research Conference. 365–368. 1 indexed citations

Brożek, Tomasz, Y.D. Chan, & C.R. Viswanathan. (1995). Plasma Etching Induced Gate Oxide Leakage. European Solid-State Device Research Conference. 255–258. 1 indexed citations

Brożek, Tomasz & C.R. Viswanathan. (1994). Homogenous Hot Hole Injection by Tunnelling in Gate Oxides of CMOS Devices. European Solid-State Device Research Conference. 515–518. 1 indexed citations

10.

Li, Xiaoyu, et al.. (1994). Reliability Study of Plasma Etching Damage in ULSI Process. MRS Proceedings. 338. 2 indexed citations

11.

Viswanathan, C.R., et al.. (1993). Charge Pumping At Cryogenic Temperatures. European Solid-State Device Research Conference. 527–530. 1 indexed citations

12.

Wang, Jia, et al.. (1991). Threshold voltage instability at low temperatures in partially depleted thin-film SOI MOSFETs. IEEE Electron Device Letters. 12(6). 300–302. 10 indexed citations

13.

Chang, Jane P., et al.. (1991). Low frequency noise in quantum-well GexSi1−x PMOSFET's. Microelectronic Engineering. 15(1-4). 19–22. 4 indexed citations

14.

Chang, Jane P., et al.. (1990). Electrical properties of GaAs/InGaAs high electron mobility transistors. International Journal of Electronics. 69(5). 621–629. 1 indexed citations

15.

Abidi, A.A., et al.. (1987). Fllcker Noise in CMOS: A Unified Model for VLSI Processes. Symposium on VLSI Technology. 85–86. 3 indexed citations

16.

Viswanathan, C.R., et al.. (1981). Measurement of interface state characteristics of MOS transistor utilising charge-pumping techniques. IEE Proceedings I Solid State and Electron Devices. 128(2). 44–44. 2 indexed citations

17.

Langan, John, et al.. (1978). Characterization of improved InSb interfaces. 594–597. 4 indexed citations

18.

Viswanathan, C.R. & Roger Loo. (1972). Internal photoemission in sapphire substrates. Applied Physics Letters. 21(8). 370–372. 8 indexed citations

19.

Viswanathan, C.R. & S. Ogura. (1968). EFFECT OF HEATING UNDER BIAS ON PHOTOELECTRIC THRESHOLD IN MOS STRUCTURE. Applied Physics Letters. 12(6). 220–222. 8 indexed citations

20.

Viswanathan, C.R., et al.. (1961). Deleading of gasoline. Defence Science Journal. 11(1). 34–44. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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