Christopher Pickering

717 total citations
47 papers, 551 citations indexed

About

Christopher Pickering is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, Christopher Pickering has authored 47 papers receiving a total of 551 indexed citations (citations by other indexed papers that have themselves been cited), including 33 papers in Electrical and Electronic Engineering, 32 papers in Atomic and Molecular Physics, and Optics and 8 papers in Materials Chemistry. Recurrent topics in Christopher Pickering's work include Semiconductor Quantum Structures and Devices (26 papers), Semiconductor materials and interfaces (21 papers) and Silicon and Solar Cell Technologies (11 papers). Christopher Pickering is often cited by papers focused on Semiconductor Quantum Structures and Devices (26 papers), Semiconductor materials and interfaces (21 papers) and Silicon and Solar Cell Technologies (11 papers). Christopher Pickering collaborates with scholars based in United Kingdom, France and Austria. Christopher Pickering's co-authors include R. T. Carline, David J. Robbins, Wai Yie Leong, M. L. Young, S. J. Bass, A. G. Cullis, A. D. Pitt, S. J. Barnett, A.R. Adams and P.J. Walker and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Applied Surface Science.

In The Last Decade

Christopher Pickering

46 papers receiving 490 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Christopher Pickering United Kingdom 13 396 369 137 61 57 47 551
I. Mojzes Hungary 12 253 0.6× 236 0.6× 76 0.6× 57 0.9× 52 0.9× 60 370
N.I. Meyer Denmark 13 329 0.8× 234 0.6× 86 0.6× 115 1.9× 45 0.8× 34 484
H. Heidemeyer Germany 11 399 1.0× 449 1.2× 255 1.9× 197 3.2× 15 0.3× 13 604
H. Shimizu Japan 11 249 0.6× 174 0.5× 104 0.8× 14 0.2× 17 0.3× 44 374
V. M. Lantratov Russia 16 668 1.7× 555 1.5× 185 1.4× 79 1.3× 15 0.3× 68 754
M. Vogt Germany 5 223 0.6× 139 0.4× 89 0.6× 141 2.3× 31 0.5× 7 379
M.L. Osowski United States 16 600 1.5× 301 0.8× 48 0.4× 68 1.1× 10 0.2× 69 660
Haowei Chen China 16 503 1.3× 518 1.4× 106 0.8× 124 2.0× 36 0.6× 60 717
B. Degroote Belgium 13 249 0.6× 133 0.4× 77 0.6× 62 1.0× 38 0.7× 26 429
T. Hopf Australia 9 323 0.8× 187 0.5× 160 1.2× 59 1.0× 49 0.9× 37 455

Countries citing papers authored by Christopher Pickering

Since Specialization
Citations

This map shows the geographic impact of Christopher Pickering's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Christopher Pickering with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Christopher Pickering more than expected).

Fields of papers citing papers by Christopher Pickering

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Christopher Pickering. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Christopher Pickering. The network helps show where Christopher Pickering may publish in the future.

Co-authorship network of co-authors of Christopher Pickering

This figure shows the co-authorship network connecting the top 25 collaborators of Christopher Pickering. A scholar is included among the top collaborators of Christopher Pickering based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Christopher Pickering. Christopher Pickering is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Pickering, Christopher, et al.. (2021). Guidance for ports: security and safety against physical, cyber and hybrid threats. Journal of Transportation Security. 14(3-4). 197–225. 5 indexed citations
2.
Pickering, Christopher, et al.. (2020). How Port Security has to evolve to address the Cyber-Physical Security Threat: lessons from the SAURON project. International Journal of Transport Development and Integration. 4(1). 29–41. 7 indexed citations
3.
Pickering, Christopher & Adnan Aydın. (2015). Modeling Roughness of Rock Discontinuity Surfaces: A Signal Analysis Approach. Rock Mechanics and Rock Engineering. 49(7). 2959–2965. 16 indexed citations
4.
Minshall, Tim, et al.. (2007). Funding technology: Britain forty years on. Cambridge University Engineering Department Publications Database. 10 indexed citations
5.
Pickering, Christopher, et al.. (2003). Performance enhancement and evaluation of deep dry etching on a production cluster platform. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4979. 34–34. 3 indexed citations
6.
Pickering, Christopher. (2001). Spectroscopic ellipsometry for monitoring and control of surfaces, thin layers and interfaces. Surface and Interface Analysis. 31(10). 927–937. 1 indexed citations
7.
Allwood, D. A., R. T. Carline, N. J. Mason, et al.. (2000). Characterization of oxide layers on GaAs substrates. Thin Solid Films. 364(1-2). 33–39. 55 indexed citations
8.
Boher, Pierre, et al.. (2000). Feasibility and applicability of integrated metrology using spectroscopic ellipsometry in a cluster tool. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4182. 115–115. 3 indexed citations
9.
Pickering, Christopher, et al.. (1995). Real-time spectroscopic ellipsometry monitoring of Si1−xGex/Si epitaxial growth. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 13(3). 740–744. 15 indexed citations
10.
Robbins, David J., et al.. (1995). Si1?XGeX/Si quantum well infrared photodetectors. Journal of Materials Science Materials in Electronics. 6(5). 363–367. 8 indexed citations
11.
Carline, R. T., Christopher Pickering, T. J. C. Hosea, & David J. Hall. (1995). Photoreflectance spectroscopy of pseudomorphic Si1−XGex(100) structures (x<0·26). Materials Science and Technology. 11(4). 416–420. 2 indexed citations
12.
Pickering, Christopher, R. T. Carline, David J. Robbins, et al.. (1993). Spectroscopic ellipsometry characterization of strained and relaxed Si1−xGex epitaxial layers. Journal of Applied Physics. 73(1). 239–250. 57 indexed citations
13.
Carline, R. T., Christopher Pickering, P. D. J. Calcott, et al.. (1993). Spectroscopic ellipsometry of Si1-xGex multi-quantum wells. Superlattices and Microstructures. 14(2-3). 157–165. 11 indexed citations
14.
Pickering, Christopher, et al.. (1993). Spectroscopic ellipsometry characterisatiion of strained Si 1-x Ge x multi quantum wells for optoelectronic applications. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1985. 414–414. 3 indexed citations
15.
Pickering, Christopher, D. C. Houghton, & J.‐M. Baribeau. (1990). Optical transitions in Si:Ge monolayer superlattices from derivative ellipsometry spectra. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1286. 165–165.
16.
Pickering, Christopher. (1983). Non-destructive characterisation of n-type InP epitaxial layers by infrared reflectivity measurements. Journal of Physics D Applied Physics. 16(2). 213–223. 3 indexed citations
17.
Pickering, Christopher. (1980). Infrared reflectivity measurements on bulk and epitaxial GaSb. (Carrier concentration and mobility measurements). Journal of Physics C Solid State Physics. 13(15). 2959–2968. 19 indexed citations
18.
Adams, A.R., Christopher Pickering, & P. Vinson. (1980). An apparatus for high uniaxial stress electrical investigations of semiconductors. Journal of Physics E Scientific Instruments. 13(12). 1331–1335. 8 indexed citations
19.
Pickering, Christopher, A.R. Adams, G. D. Pitt, & Manan Vyas. (1975). The effect of pressure on the high electric field instabilities in n-type GaAs. Journal of Physics C Solid State Physics. 8(2). 129–137. 10 indexed citations
20.
Pickering, Christopher, A.R. Adams, & G. D. Pitt. (1975). The effect of pressure on impact ionisation and the Gunn effect in InAs. Solid State Communications. 16(12). 1359–1363. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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