Bruce E. Deal

2.8k total citations · 1 hit paper
22 papers, 2.1k citations indexed

About

Bruce E. Deal is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Bruce E. Deal has authored 22 papers receiving a total of 2.1k indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Electrical and Electronic Engineering, 8 papers in Materials Chemistry and 4 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Bruce E. Deal's work include Semiconductor materials and devices (13 papers), Silicon and Solar Cell Technologies (10 papers) and Silicon Nanostructures and Photoluminescence (6 papers). Bruce E. Deal is often cited by papers focused on Semiconductor materials and devices (13 papers), Silicon and Solar Cell Technologies (10 papers) and Silicon Nanostructures and Photoluminescence (6 papers). Bruce E. Deal collaborates with scholars based in United States. Bruce E. Deal's co-authors include R. R. Razouk, C. R. Helms, P. J. Caplan, Edward H. Poindexter, Harry J. Svec, J.M. Early, J.J. Barnes and Jan B. Talbot and has published in prestigious journals such as Journal of the American Chemical Society, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

Bruce E. Deal

21 papers receiving 2.0k citations

Hit Papers

Interface states and electron spin resonance centers in t... 1981 2026 1996 2011 1981 100 200 300 400
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

  1. Interface states and electron spin resonance centers in thermally oxidized (111) and (100) silicon wafers
    1981 445 citations Edward H. Poindexter, P. J. Caplan et al. Journal of Applied Physics profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Bruce E. Deal United States 13 1.9k 974 607 220 143 22 2.1k
B. G. Yacobi United States 19 1.1k 0.6× 1.0k 1.1× 589 1.0× 334 1.5× 79 0.6× 65 1.8k
K. Lehovec United States 23 1.4k 0.7× 577 0.6× 711 1.2× 168 0.8× 60 0.4× 85 1.8k
J. Stuke Germany 29 2.2k 1.2× 2.2k 2.3× 642 1.1× 168 0.8× 459 3.2× 63 2.9k
J. Hornstra Netherlands 12 804 0.4× 747 0.8× 922 1.5× 221 1.0× 77 0.5× 23 1.7k
Kiyomasa Sugii Japan 19 560 0.3× 648 0.7× 676 1.1× 309 1.4× 168 1.2× 41 1.2k
D. J. Gravesteijn Netherlands 25 1.5k 0.8× 699 0.7× 744 1.2× 205 0.9× 44 0.3× 88 1.8k
P. H. Fuoss United States 20 745 0.4× 1.1k 1.1× 502 0.8× 239 1.1× 214 1.5× 29 1.7k
T. H. DiStefano United States 17 840 0.4× 605 0.6× 341 0.6× 104 0.5× 192 1.3× 29 1.3k
Shintaro Miyazawa Japan 28 1.3k 0.7× 1.1k 1.1× 1.4k 2.3× 408 1.9× 155 1.1× 109 2.7k
W. E. Collins United States 20 755 0.4× 689 0.7× 342 0.6× 208 0.9× 175 1.2× 70 1.2k

Countries citing papers authored by Bruce E. Deal

Since Specialization
Citations

This map shows the geographic impact of Bruce E. Deal's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bruce E. Deal with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bruce E. Deal more than expected).

Fields of papers citing papers by Bruce E. Deal

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Bruce E. Deal. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bruce E. Deal. The network helps show where Bruce E. Deal may publish in the future.

Co-authorship network of co-authors of Bruce E. Deal

This figure shows the co-authorship network connecting the top 25 collaborators of Bruce E. Deal. A scholar is included among the top collaborators of Bruce E. Deal based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Bruce E. Deal. Bruce E. Deal is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Deal, Bruce E. & Jan B. Talbot. (1997). Principia Moore. The Electrochemical Society Interface. 6(1). 18–23. 1 indexed citations
2.
Helms, C. R. & Bruce E. Deal. (1993). The Physics and Chemistry of SiO2 and the Si-SiO2 Interface 2. 150 indexed citations
3.
Deal, Bruce E. & C. R. Helms. (1992). Vapor Phase Cleaning of Silicon Wafers. MRS Proceedings. 259. 1 indexed citations
4.
Helms, C. R. & Bruce E. Deal. (1988). The Physics and Chemistry of SiO2 and the Si-SiO2 Interface. 340 indexed citations
5.
Razouk, R. R. & Bruce E. Deal. (1982). Hydrogen Anneal Effects on Metal‐Semiconductor Work Function Difference. Journal of The Electrochemical Society. 129(4). 806–810. 23 indexed citations
6.
Razouk, R. R., et al.. (1981). Kinetics of High Pressure Oxidation of Silicon in Pyrogenic Steam. Journal of The Electrochemical Society. 128(10). 2214–2220. 54 indexed citations
7.
Poindexter, Edward H., P. J. Caplan, Bruce E. Deal, & R. R. Razouk. (1981). Interface states and electron spin resonance centers in thermally oxidized (111) and (100) silicon wafers. Journal of Applied Physics. 52(2). 879–884. 445 indexed citations breakdown →
8.
Deal, Bruce E.. (1980). Standardized Terminology for Oxide Charges Associated with Thermally Oxidized Silicon. Journal of The Electrochemical Society. 127(4). 979–981. 35 indexed citations
9.
Caplan, P. J., Edward H. Poindexter, Bruce E. Deal, & R. R. Razouk. (1979). ESR centers, interface states, and oxide fixed charge in thermally oxidized silicon wafers. Journal of Applied Physics. 50(9). 5847–5854. 357 indexed citations
10.
Razouk, R. R. & Bruce E. Deal. (1979). Dependence of Interface State Density on Silicon Thermal Oxidation Process Variables. Journal of The Electrochemical Society. 126(9). 1573–1581. 192 indexed citations
11.
Barnes, J.J., et al.. (1979). Low Temperature Differential Oxidation for Double Polysilicon VLSI Devices. Journal of The Electrochemical Society. 126(10). 1779–1785. 6 indexed citations
12.
Deal, Bruce E. & J.M. Early. (1979). The Evolution of Silicon Semiconductor Technology: 1952–1977. Journal of The Electrochemical Society. 126(1). 20C–32C. 14 indexed citations
13.
Deal, Bruce E.. (1978). Thermal Oxidation Kinetics of Silicon in Pyrogenic  H 2 O  and 5% HCl /  H 2 O  Mixtures. Journal of The Electrochemical Society. 125(4). 576–579. 57 indexed citations
14.
15.
Deal, Bruce E.. (1974). The Current Understanding of Charges in the Thermally Oxidized Silicon Structure. Journal of The Electrochemical Society. 121(6). 198C–198C. 265 indexed citations
16.
Deal, Bruce E.. (1963). The Oxidation of Silicon in Dry Oxygen, Wet Oxygen, and Steam. Journal of The Electrochemical Society. 110(6). 527–527. 97 indexed citations
17.
Deal, Bruce E.. (1963). Discussion of “The Oxidation of Silicon in Dry Oxygen, Wet Oxygen and Steam Supplementary Data”. Journal of The Electrochemical Society. 110(12). 1292–1292. 1 indexed citations
18.
Deal, Bruce E.. (1962). Epitaxial Deposition of Silicon in a Hot-Tube Furnace. Journal of The Electrochemical Society. 109(6). 514–514. 6 indexed citations
19.
Deal, Bruce E. & Harry J. Svec. (1956). Metal-Water Reactions. Journal of The Electrochemical Society. 103(8). 421–421. 5 indexed citations
20.
Deal, Bruce E. & Harry J. Svec. (1953). Metal—Water Reactions. II. Kinetics of the Reaction between Lithium and Water Vapor. Journal of the American Chemical Society. 75(24). 6173–6175. 9 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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