Bor‐Yuan Shew

505 total citations
26 papers, 432 citations indexed

About

Bor‐Yuan Shew is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Materials Chemistry. According to data from OpenAlex, Bor‐Yuan Shew has authored 26 papers receiving a total of 432 indexed citations (citations by other indexed papers that have themselves been cited), including 19 papers in Electrical and Electronic Engineering, 8 papers in Biomedical Engineering and 6 papers in Materials Chemistry. Recurrent topics in Bor‐Yuan Shew's work include Advancements in Photolithography Techniques (5 papers), Metal and Thin Film Mechanics (5 papers) and Advanced Battery Materials and Technologies (4 papers). Bor‐Yuan Shew is often cited by papers focused on Advancements in Photolithography Techniques (5 papers), Metal and Thin Film Mechanics (5 papers) and Advanced Battery Materials and Technologies (4 papers). Bor‐Yuan Shew collaborates with scholars based in Taiwan, United States and Australia. Bor‐Yuan Shew's co-authors include Jow-Lay Huang, Ding‐Fwu Lii, Kai-Shing Yang, Chi‐Chuan Wang, Jow‐Lay Huang, Ching‐Yu Chiang, Chih‐Hao Lee, Chih‐Wei Hu, Neeraj Sharma and Vanessa K. Peterson and has published in prestigious journals such as Journal of Power Sources, Scientific Reports and The Journal of Physical Chemistry C.

In The Last Decade

Bor‐Yuan Shew

26 papers receiving 419 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Bor‐Yuan Shew Taiwan 12 230 126 113 102 94 26 432
Harumichi Sato Japan 13 300 1.3× 125 1.0× 96 0.8× 137 1.3× 97 1.0× 53 517
Vijay Bhatia Australia 15 71 0.3× 120 1.0× 315 2.8× 49 0.5× 239 2.5× 42 528
Chris H. Stoessel United States 6 259 1.1× 287 2.3× 324 2.9× 122 1.2× 139 1.5× 8 647
А.M. Venter South Africa 16 89 0.4× 197 1.6× 211 1.9× 40 0.4× 440 4.7× 83 696
Remco Geurts Netherlands 9 154 0.7× 78 0.6× 170 1.5× 127 1.2× 139 1.5× 24 484
HL Fraser United States 10 157 0.7× 59 0.5× 313 2.8× 109 1.1× 218 2.3× 27 536
Gan Feng China 14 519 2.3× 59 0.5× 106 0.9× 53 0.5× 44 0.5× 49 648
Yu‐Wei Lin Taiwan 11 139 0.6× 161 1.3× 251 2.2× 63 0.6× 65 0.7× 36 395
Shixiong Wu China 15 153 0.7× 42 0.3× 146 1.3× 173 1.7× 297 3.2× 50 589
Mo‐Rigen He United States 14 67 0.3× 137 1.1× 459 4.1× 125 1.2× 212 2.3× 24 583

Countries citing papers authored by Bor‐Yuan Shew

Since Specialization
Citations

This map shows the geographic impact of Bor‐Yuan Shew's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bor‐Yuan Shew with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bor‐Yuan Shew more than expected).

Fields of papers citing papers by Bor‐Yuan Shew

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Bor‐Yuan Shew. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bor‐Yuan Shew. The network helps show where Bor‐Yuan Shew may publish in the future.

Co-authorship network of co-authors of Bor‐Yuan Shew

This figure shows the co-authorship network connecting the top 25 collaborators of Bor‐Yuan Shew. A scholar is included among the top collaborators of Bor‐Yuan Shew based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Bor‐Yuan Shew. Bor‐Yuan Shew is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Chen, Shiwei, Shin‐An Chen, Ting‐Shan Chan, et al.. (2022). Polymorphic transition to metastable phases in hollow structured silicon anode in a Li-ions battery. Applied Materials Today. 26. 101333–101333. 5 indexed citations
2.
Li, Jia‐Han, et al.. (2017). Fabrication of metrology test structures with helium ion beam direct write. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 10145. 1014519–1014519. 2 indexed citations
3.
Wang, Chun‐Chieh, Yen‐Fang Song, Sheng‐Rong Song, et al.. (2015). Evolution and Function of Dinosaur Teeth at Ultramicrostructural Level Revealed Using Synchrotron Transmission X-ray Microscopy. Scientific Reports. 5(1). 15202–15202. 36 indexed citations
4.
5.
Hu, Chih‐Wei, Tsan‐Yao Chen, Ching‐Yu Chiang, et al.. (2014). Real-time investigation on the influences of vanadium additives to the structural and chemical state evolutions of LiFePO4 for enhancing the electrochemical performance of lithium-ion battery. Journal of Power Sources. 270. 449–456. 7 indexed citations
6.
Tsui, Bing‐Yue, et al.. (2014). Investigation of radiation hardness of HfO<inf>2</inf> resistive random access memory. 100. 1–2. 3 indexed citations
7.
Yang, Wencheng, Yu‐Sheng Huang, Bor‐Yuan Shew, & Chien‐Chung Fu. (2013). Study on diffraction effect and microstructure profile fabricated by one-step backside lithography. Journal of Micromechanics and Microengineering. 23(3). 35004–35004. 11 indexed citations
8.
Hu, Chih‐Wei, Neeraj Sharma, Ching‐Yu Chiang, et al.. (2013). Real-time investigation of the structural evolution of electrodes in a commercial lithium-ion battery containing a V-added LiFePO4 cathode using in-situ neutron powder diffraction. Journal of Power Sources. 244. 158–163. 24 indexed citations
9.
10.
Lee, Yin‐Yu, et al.. (2012). Extreme UV diffraction grating fabricated by nanoimprint lithography. Microelectronic Engineering. 98. 194–197. 11 indexed citations
11.
Lee, Yin‐Yu, et al.. (2011). EUV interferometric lithography and structural characterization of an EUV diffraction grating with nondestructive spectroscopic ellipsometry. Microelectronic Engineering. 88(8). 2639–2643. 12 indexed citations
12.
Shew, Bor‐Yuan, et al.. (2005). X-ray micromachining SU-8 resist for a terahertz photonic filter. Journal of Physics D Applied Physics. 38(7). 1097–1103. 21 indexed citations
13.
Shew, Bor‐Yuan, et al.. (2003). High resolution x-ray micromachining using SU-8 resist. Journal of Micromechanics and Microengineering. 13(5). 708–713. 12 indexed citations
14.
Yang, Kai-Shing, et al.. (2003). Investigation of the flow characteristics within a micronozzle/diffuser. Journal of Micromechanics and Microengineering. 14(1). 26–31. 49 indexed citations
15.
Yang, Kai-Shing, et al.. (2003). A Study of the Fabrication and Analysis of Micro Diffuser/Nozzles. 781–786. 1 indexed citations
16.
Shew, Bor‐Yuan, Ruey‐Shing Huang, Yong Q. Cai, et al.. (2002). Use of deep reactive ion etching in the fabrication of high-efficiency high-resolution crystal x-ray analyzers. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4783. 131–131. 1 indexed citations
17.
Shew, Bor‐Yuan, et al.. (1999). Effects of Aluminum Concentration on the Oxidation Behaviors of Reactively Sputtered TiAlN Films. Journal of the American Ceramic Society. 82(3). 696–704. 53 indexed citations
18.
Lii, Ding‐Fwu, Jow-Lay Huang, & Bor‐Yuan Shew. (1998). Modeling of reactively sputtered TiAlN films. Thin Solid Films. 335(1-2). 122–126. 9 indexed citations
19.
Shew, Bor‐Yuan & Jow-Lay Huang. (1995). Quantitative AES investigation of magnetron sputtered Ti-Al-N films. Surface and Coatings Technology. 73(1-2). 66–72. 12 indexed citations
20.
Shew, Bor‐Yuan & Jow‐Lay Huang. (1992). Investigation of chemical reactions in TiB2/Si3N4 composites. Materials Science and Engineering A. 159(1). 127–133. 19 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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