B. Langley

459 total citations
14 papers, 361 citations indexed

About

B. Langley is a scholar working on Condensed Matter Physics, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, B. Langley has authored 14 papers receiving a total of 361 indexed citations (citations by other indexed papers that have themselves been cited), including 9 papers in Condensed Matter Physics, 7 papers in Electrical and Electronic Engineering and 6 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in B. Langley's work include Physics of Superconductivity and Magnetism (9 papers), Superconducting Materials and Applications (4 papers) and Copper Interconnects and Reliability (3 papers). B. Langley is often cited by papers focused on Physics of Superconductivity and Magnetism (9 papers), Superconducting Materials and Applications (4 papers) and Copper Interconnects and Reliability (3 papers). B. Langley collaborates with scholars based in United States, Israel and Germany. B. Langley's co-authors include M. R. Beasley, Steven M. Anlage, R. F. W. Pease, G. Deutscher, Oh‐Kyong Kwon, Chang‐Beom Eom, R. C. Taber, S. Tahara, Jinuk Luke Shin and Ana Sonia Leon and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Review of Scientific Instruments.

In The Last Decade

B. Langley

13 papers receiving 335 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
B. Langley United States 7 284 135 120 79 73 14 361
S.L. Yan China 11 314 1.1× 110 0.8× 53 0.4× 99 1.3× 75 1.0× 47 364
J. Bergman United States 13 101 0.4× 270 2.0× 482 4.0× 36 0.5× 60 0.8× 38 514
Yasuhiro Nakasha Japan 16 99 0.3× 228 1.7× 700 5.8× 19 0.2× 51 0.7× 94 721
B. Janossy France 10 211 0.7× 95 0.7× 129 1.1× 91 1.2× 22 0.3× 18 347
Mohammed Bawatna Germany 4 35 0.1× 189 1.4× 156 1.3× 91 1.2× 86 1.2× 10 289
T. S. Tighe United States 8 355 1.3× 414 3.1× 93 0.8× 42 0.5× 9 0.1× 12 470
Frank Schnieder Germany 11 88 0.3× 101 0.7× 425 3.5× 27 0.3× 42 0.6× 39 454
J. Pusl United States 7 84 0.3× 198 1.5× 321 2.7× 25 0.3× 35 0.5× 17 400
R. Bowen United States 10 226 0.8× 90 0.7× 395 3.3× 55 0.7× 38 0.5× 24 426
A. Gómez Spain 8 106 0.4× 149 1.1× 64 0.5× 64 0.8× 40 0.5× 38 236

Countries citing papers authored by B. Langley

Since Specialization
Citations

This map shows the geographic impact of B. Langley's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. Langley with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. Langley more than expected).

Fields of papers citing papers by B. Langley

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by B. Langley. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. Langley. The network helps show where B. Langley may publish in the future.

Co-authorship network of co-authors of B. Langley

This figure shows the co-authorship network connecting the top 25 collaborators of B. Langley. A scholar is included among the top collaborators of B. Langley based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with B. Langley. B. Langley is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

14 of 14 papers shown
1.
Leon, Ana Sonia, B. Langley, & Jinuk Luke Shin. (2006). The UltraSPARC T1 Processor: CMT Reliability. 555–562. 21 indexed citations
3.
Suehle, John S., et al.. (2002). The practical side of thin dielectric monitoring and characterization. 33. 1–2. 1 indexed citations
4.
5.
Langley, B., et al.. (1997). Scalability Of Plasma Damage With Gate Oxide Thickness. 91 11. 11–14. 4 indexed citations
6.
Anlage, Steven M., B. Langley, G. Deutscher, et al.. (1991). Temperature dependence of the magnetic penetration depth in Nb, NbCN and YBa2Cu3O7-δ thin films. Physica B Condensed Matter. 169(1-4). 671–672. 3 indexed citations
7.
Anlage, Steven M., et al.. (1991). Measurements of the temperature dependence of the magnetic penetration depth inYBa2Cu3O7δsuperconducting thin films. Physical review. B, Condensed matter. 44(17). 9764–9767. 99 indexed citations
8.
Langley, B., Steven M. Anlage, R. F. W. Pease, & M. R. Beasley. (1991). Magnetic penetration depth measurements of superconducting thin films by a microstrip resonator technique. Review of Scientific Instruments. 62(7). 1801–1812. 51 indexed citations
9.
Anlage, Steven M., B. Langley, Chang‐Beom Eom, et al.. (1990). Magnetic Penetration Depth Measurements and Inhomogeneity in YBa2Cu3O7−δ Superconducting Thin Films. MRS Proceedings. 195. 2 indexed citations
10.
Anlage, Steven M., et al.. (1990). Magnetic penetration depth measurements with the microstrip resonator technique. Journal of Superconductivity. 3(3). 311–316. 22 indexed citations
11.
Langley, B. & R. F. W. Pease. (1990). Superconducting interconnects for VLSI multi-chip system integration. 59–60. 2 indexed citations
12.
Anlage, Steven M., S. Tahara, B. Langley, et al.. (1989). Measurements of the magnetic penetration depth in YBa2Cu3O7−δ thin films by the microstrip resonator technique. Applied Physics Letters. 54(26). 2710–2712. 74 indexed citations
13.
Anlage, Steven M., B. Langley, J. Halbritter, et al.. (1989). Magnetic penetration depth measurements in low and high Tc thin film superconductors at microwave frequencies. Physica C Superconductivity. 162-164. 1645–1646. 9 indexed citations
14.
Kwon, Oh‐Kyong, B. Langley, R. F. W. Pease, & M. R. Beasley. (1987). Superconductors as very high-speed system-level interconnects. IEEE Electron Device Letters. 8(12). 582–585. 71 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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