Armin Moser

737 total citations
18 papers, 670 citations indexed

About

Armin Moser is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, Armin Moser has authored 18 papers receiving a total of 670 indexed citations (citations by other indexed papers that have themselves been cited), including 10 papers in Electrical and Electronic Engineering, 7 papers in Atomic and Molecular Physics, and Optics and 7 papers in Materials Chemistry. Recurrent topics in Armin Moser's work include Force Microscopy Techniques and Applications (6 papers), Molecular Junctions and Nanostructures (6 papers) and Organic Electronics and Photovoltaics (6 papers). Armin Moser is often cited by papers focused on Force Microscopy Techniques and Applications (6 papers), Molecular Junctions and Nanostructures (6 papers) and Organic Electronics and Photovoltaics (6 papers). Armin Moser collaborates with scholars based in Austria, Germany and Netherlands. Armin Moser's co-authors include Roland Resel, Harry J. Wondergem, Ingo Salzmann, Dago M. de Leeuw, Alfred Neuhold, Edsger C. P. Smits, Martin Oehzelt, Gerwin H. Gelinck, Sergey A. Ponomarenko and Simon G. J. Mathijssen and has published in prestigious journals such as Advanced Materials, ACS Nano and Applied Physics Letters.

In The Last Decade

Armin Moser

18 papers receiving 665 citations

Peers

Countries citing papers authored by Armin Moser

Since Specialization

Citations

This map shows the geographic impact of Armin Moser's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Armin Moser with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Armin Moser more than expected).

Fields of papers citing papers by Armin Moser

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Armin Moser. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Armin Moser. The network helps show where Armin Moser may publish in the future.

Co-authorship network of co-authors of Armin Moser

This figure shows the co-authorship network connecting the top 25 collaborators of Armin Moser. A scholar is included among the top collaborators of Armin Moser based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Armin Moser. Armin Moser is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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18 of 18 papers shown

#	Work	Indexed citations
1	Intensity corrections for grazing-incidence X-ray diffraction of thin films using static area detectors 2024 ·Journal of Applied Crystallography ·F Gasser, Josef Simbrunner, (unknown), Armin Moser, Hans‐Georg Steinrück, Roland Resel	2
2	A General Small-Angle X-ray Scattering-Based Screening Protocol for Studying Physical Stability of Protein Formulations 2021 ·Pharmaceutics ·Fangrong Zhang, Gesa Richter, Benjamin Bourgeois, Emil Spreitzer, Armin Moser, Andreas Keilbach, Petra Kotnik, Tobias Madl	6
3	A disordered layered phase in thin films of sexithiophene 2013 ·Chemical Physics Letters ·Armin Moser, Ingo Salzmann, Martin Oehzelt, Alfred Neuhold, (unknown), J. Ivančo, (unknown), (unknown), Dietrich R. T. Zahn, Detlef‐M. Smilgies, Roland Resel	34
4	Solution‐Processable Septithiophene Monolayer Transistor 2012 ·Advanced Materials ·(unknown), Fatemeh Gholamrezaie, Jingbo Wang, Andreas Kreyes, Ulrich Ziener, Denis V. Anokhin, Dimitri A. Ivanov, Armin Moser, Alfred Neuhold, Ingo Salzmann, Roland Resel, Dago M. de Leeuw, Stefan C. J. Meskers, Martin Moeller, Ahmed Mourran	58
5	Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment 2012 ·Journal of Applied Crystallography ·Markus Neuschitzer, Armin Moser, Alfred Neuhold, (unknown), Barbara Stadlober, Martin Oehzelt, Ingo Salzmann, Roland Resel, Jiřı́ Novák	19
6	Interface Induced Crystal Structures of Dioctyl-Terthiophene Thin Films 2012 ·Langmuir ·Oliver Werzer, (unknown), (unknown), Gabin Gbabode, Yves Geerts, Oleg Konovalov, Armin Moser, Jiřı́ Novák, Roland Resel, Michele Sferrazza	20
7	N‐Type Self‐Assembled Monolayer Field‐Effect Transistors and Complementary Inverters 2012 ·Advanced Functional Materials ·(unknown), Xiaoran Li, Fatemeh Gholamrezaie, Edsger C. P. Smits, Alfred Neuhold, Armin Moser, C. van der Marel, Gerwin H. Gelinck, Roland Resel, Dago M. de Leeuw, Peter Strohriegl	53
8	Epitaxial Growth of π-Stacked Perfluoropentacene on Graphene-Coated Quartz 2012 ·ACS Nano ·Ingo Salzmann, Armin Moser, Martin Oehzelt, Tobias Breuer, Xinliang Feng, Zhen‐Yu Juang, Dmitrii Nabok, Raffaele Guido Della Valle, Steffen Duhm, Georg Heimel, Aldo Brillante, Elisabetta Venuti, Ivano Bilotti, Christos Christodoulou, Johannes Frisch, Peter Puschnig, Claudia Draxl, Gregor Witte, Kläus Müllen, Norbert Koch	103
9	Substrate‐Induced Crystal Plastic Phase of a Discotic Liquid Crystal 2011 ·Advanced Materials ·Gabin Gbabode, (unknown), (unknown), Guillaume Schweicher, Armin Moser, Pascal Viville, Roberto Lazzaroni, Yves Geerts	24
10	Microstructure and Phase Behavior of a Quinquethiophene-Based Self-Assembled Monolayer as a Function of Temperature 2011 ·The Journal of Physical Chemistry C ·(unknown), Simon G. J. Mathijssen, Fatemeh Gholamrezaie, Armin Moser, Alfred Neuhold, Jiřı́ Novák, Sergey A. Ponomarenko, Quan Shen, Christian Teichert, Gregor Hlawacek, Peter Puschnig, Claudia Draxl, Roland Resel, Dago M. de Leeuw	20
11	Structure Solution of the 6,13-Pentacenequinone Surface-Induced Polymorph by Combining X-ray Diffraction Reciprocal-Space Mapping and Theoretical Structure Modeling 2011 ·Crystal Growth & Design ·Ingo Salzmann, Dmitrii Nabok, Martin Oehzelt, Steffen Duhm, Armin Moser, Georg Heimel, Peter Puschnig, Claudia Draxl, Jürgen P. Rabe, Norbert Koch	39
12	X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments 2011 ·Alfred Neuhold, Jiřı́ Novák, (unknown), Armin Moser, Tatjana Djuric, Souren Grigorian, (unknown), (unknown), Roland Resel	1
13	Temperature stability of the pentacene thin-film phase 2011 ·Applied Physics Letters ·Armin Moser, Jiřı́ Novák, (unknown), Tatjana Djuric, Oliver Werzer, Anja Haase, Roland Resel	21
14	PYGID: A SOFTWARE FOR THE ANALYSIS OF GRAZING INCIDENCE X-RAY DIFFRACTION DATA 2011 ·Armin Moser, Markus Neuschitzer, Alfred Neuhold, Tatjana Djuric, Jiří Novák, Ingo Salzmann, Martin Oehzelt, Roland Resel	3
15	Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study 2011 ·Journal of Applied Physics ·Alfred Neuhold, Stefanie Fladischer, Stefan Mitsche, (unknown), Armin Moser, Jiřı́ Novák, Detlef‐M. Smilgies, Elke Kraker, Bernhard Lamprecht, Anja Haase, Werner Grogger, Roland Resel	7
16	Crystallization of pentacene thin films on polymeric dielectrics 2011 ·Synthetic Metals ·Armin Moser, (unknown), Alfred Neuhold, (unknown), (unknown), Matthias Edler, Thomas Grießer, Anja Haase, Detlef‐M. Smilgies, (unknown), Roland Resel	8
17	Monolayer coverage and channel length set the mobility in self-assembled monolayer field-effect transistors 2009 ·Nature Nanotechnology ·Simon G. J. Mathijssen, Edsger C. P. Smits, Paul A. van Hal, Harry J. Wondergem, Sergey A. Ponomarenko, Armin Moser, Roland Resel, P. A. Bobbert, Martijn Kemerink, René A. J. Janssen, Dago M. de Leeuw	122
18	Controlled Deposition of Highly Ordered Soluble Acene Thin Films: Effect of Morphology and Crystal Orientation on Transistor Performance 2009 ·Advanced Materials ·(unknown), B. K. Charlotte Kjellander, Bjoern Niesen, (unknown), J. B. P. H. van der Putten, Kris Myny, Harry J. Wondergem, Armin Moser, Roland Resel, Albert J. J. M. van Breemen, (unknown), Paul Heremans, John E. Anthony, Gerwin H. Gelinck	130

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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