A. Liebel

511 total citations
20 papers, 169 citations indexed

About

A. Liebel is a scholar working on Surfaces, Coatings and Films, Structural Biology and Radiation. According to data from OpenAlex, A. Liebel has authored 20 papers receiving a total of 169 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Surfaces, Coatings and Films, 7 papers in Structural Biology and 7 papers in Radiation. Recurrent topics in A. Liebel's work include Electron and X-Ray Spectroscopy Techniques (16 papers), Advanced Electron Microscopy Techniques and Applications (7 papers) and Nuclear Physics and Applications (5 papers). A. Liebel is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (16 papers), Advanced Electron Microscopy Techniques and Applications (7 papers) and Nuclear Physics and Applications (5 papers). A. Liebel collaborates with scholars based in Germany, Italy and Japan. A. Liebel's co-authors include H. Soltau, L. Strüder, Sebastian Ihle, H. Ryll, Robert Hartmann, Andreas Rosenauer, P. Holl, Ryusuke Sagawa, Julia Schmidt and Martin Simson and has published in prestigious journals such as Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment, Microscopy and Microanalysis and Journal of Instrumentation.

In The Last Decade

A. Liebel

16 papers receiving 161 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
A. Liebel Germany	4	84	77	71	43	32	20	169
Sebastian Ihle Germany	7	142 1.7×	163 2.1×	106 1.5×	65 1.5×	60 1.9×	23	271
I. P. J. Shipsey United States	7	43 0.5×	49 0.6×	89 1.3×	62 1.4×	41 1.3×	33	248
Mikhail Lyubomirskiy Germany	11	33 0.4×	102 1.3×	220 3.1×	36 0.8×	30 0.9×	28	290
W. Verhoeven Netherlands	8	65 0.8×	117 1.5×	59 0.8×	88 2.0×	139 4.3×	15	261
R. Plackett United Kingdom	8	67 0.8×	81 1.1×	138 1.9×	80 1.9×	23 0.7×	24	279
J. M. Castro Spain	5	43 0.5×	93 1.2×	71 1.0×	79 1.8×	83 2.6×	8	191
Magnus Lindblom Sweden	10	45 0.5×	130 1.7×	216 3.0×	102 2.4×	82 2.6×	30	330
Hikaru Kishimoto Japan	8	17 0.2×	51 0.7×	140 2.0×	63 1.5×	41 1.3×	23	194
Michael Bertilson Sweden	11	38 0.5×	134 1.7×	228 3.2×	78 1.8×	43 1.3×	25	304
P.L.E.M. Pasmans Netherlands	4	78 0.9×	184 2.4×	100 1.4×	102 2.4×	157 4.9×	5	292

Countries citing papers authored by A. Liebel

Since Specialization

Citations

This map shows the geographic impact of A. Liebel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Liebel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Liebel more than expected).

Fields of papers citing papers by A. Liebel

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. Liebel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Liebel. The network helps show where A. Liebel may publish in the future.

Co-authorship network of co-authors of A. Liebel

This figure shows the co-authorship network connecting the top 25 collaborators of A. Liebel. A scholar is included among the top collaborators of A. Liebel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. Liebel. A. Liebel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Heinzinger, K., et al.. (2019). Pushing the Measuring Capabilities of Silicon Drift Detectors for EDX Imaging of Low-Z Materials Down to Lithium. Microscopy and Microanalysis. 25(S2). 1768–1769. 1 indexed citations

Schmid, Maximilian, A. Liebel, & H. Soltau. (2019). Optimizing Workflow in Electron Microscopes with Fast BSE/STEM Diodes and Preamplifier Modules. Microscopy and Microanalysis. 25(S2). 538–539. 2 indexed citations

Schmid, Maximilian, et al.. (2019). Reduce Charging Effects on Beam Sensitive Material by Optimized Scanning Routines in SEM. Microscopy and Microanalysis. 25(S2). 474–475. 1 indexed citations

Liebel, A., et al.. (2018). Silicon Drift Detectors in Electron Microscopy - An Over 20 Year History with a Bright Future. Microscopy and Microanalysis. 24(S1). 796–797. 1 indexed citations

Schöning, A., et al.. (2017). A Compact High Solid Angle EDX Detector System for SEM and TEM. Microscopy and Microanalysis. 23(S1). 76–77. 2 indexed citations

Liebel, A., et al.. (2016). Novel Silicon Drift Detector Devices for Ultra-Fast, High-Resolution X-ray Spectroscopy. Microscopy and Microanalysis. 22(S3). 40–41. 2 indexed citations

Ryll, H., Martin Simson, Robert Hartmann, et al.. (2016). A pnCCD-based, fast direct single electron imaging camera for TEM and STEM. Journal of Instrumentation. 11(4). P04006–P04006. 92 indexed citations

Liebel, A., et al.. (2014). A Detector for Fast Electron Current Measurements based on Silicon Drift Detector Technology. Microscopy and Microanalysis. 20(S3). 28–29.

Herrmann, J., Sabina Jeschke, Gary S. Krenz, et al.. (2014). Large Solid Angle Silicon Drift Detectors for EDX Analysis in TEM. Microscopy and Microanalysis. 20(S3). 1124–1125.

10.

Liebel, A., et al.. (2014). Concepts for an Annular Pole Piece Detector for the Simultaneous Measurement of X-Rays and Backscattered Electrons Inside a SEM. Microscopy and Microanalysis. 20(S3). 1118–1119. 1 indexed citations

11.

Ryll, H., Sebastian Ihle, H. Soltau, et al.. (2013). Results of a pnCCD Based Ultrafast Direct Single Electron Imaging Camera for Transmission Electron Microscopy. Microscopy and Microanalysis. 19(S2). 1160–1161. 5 indexed citations

12.

Herrmann, J., Sabina Jeschke, Gary S. Krenz, et al.. (2013). Improved SDD Detectors for Ultra-Fast, High-Resolution EDS in Microanalysis. Microscopy and Microanalysis. 19(S2). 1270–1271. 3 indexed citations

13.

Herrmann, J., Sabina Jeschke, P. Lechner, et al.. (2012). Optimizing the Low Energy Performance of Pole-shoe EDX Detectors. Microscopy and Microanalysis. 18(S2). 1202–1203. 2 indexed citations

14.

Ihle, Sebastian, Robert Hartmann, P. Holl, et al.. (2012). A compact high-speed pnCCD camera for optical and x-ray applications. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8453. 84531A–84531A. 2 indexed citations

15.

Herrmann, J., P. Lechner, A. Liebel, et al.. (2011). New Design and Measurements with 60 mm² Rococo2 SDD Detectors. Microscopy and Microanalysis. 17(S2). 1206–1207. 1 indexed citations

16.

Lechner, P., G. Lutz, H. Soltau, et al.. (2010). Expanding the detection efficiency of silicon drift detectors. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 624(2). 270–276. 46 indexed citations

17.

Soltau, H., S. Bjeoumikhova, Robert Hartmann, et al.. (2010). High Speed and Very Large pnCCDs for X-ray and Electron Imaging. Microscopy and Microanalysis. 16(S2). 898–899. 1 indexed citations

18.

Soltau, H., Sabina Jeschke, P. Lechner, et al.. (2010). Excellent Performance with 100 mm² Silicon Drift Detectors. Microscopy and Microanalysis. 16(S2). 1306–1307. 1 indexed citations

19.

Soltau, H., A. Liebel, A. E. Simsek, et al.. (2009). New Detector Architecture, for Electron Microscopes with SDDs. Microscopy and Microanalysis. 15(S2). 204–205. 5 indexed citations

20.

Soltau, H., G. Lutz, P. Lechner, et al.. (2008). F-64 Expanding the Detector Efficiency of Silicon Drift Detectors with Optimized Radiation Entrance Window. Powder Diffraction. 23(2). 173–173. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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