A. H. Verbruggen

1.4k total citations
63 papers, 1.1k citations indexed

About

A. H. Verbruggen is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, A. H. Verbruggen has authored 63 papers receiving a total of 1.1k indexed citations (citations by other indexed papers that have themselves been cited), including 40 papers in Electrical and Electronic Engineering, 36 papers in Atomic and Molecular Physics, and Optics and 26 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in A. H. Verbruggen's work include Copper Interconnects and Reliability (25 papers), Semiconductor materials and devices (21 papers) and Quantum and electron transport phenomena (15 papers). A. H. Verbruggen is often cited by papers focused on Copper Interconnects and Reliability (25 papers), Semiconductor materials and devices (21 papers) and Quantum and electron transport phenomena (15 papers). A. H. Verbruggen collaborates with scholars based in Netherlands, Germany and United States. A. H. Verbruggen's co-authors include S. Radelaar, G. C. A. M. Janssen, J. E. Mooij, R. Griessen, L.J. Geerligs, Mathijs Peters, J. Caro, P. A. M. Holweg, R. H. Koch and Wolfgang Belzig and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

A. H. Verbruggen

60 papers receiving 1.1k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
A. H. Verbruggen Netherlands 18 717 464 295 198 192 63 1.1k
U. Kawabe Japan 19 619 0.9× 370 0.8× 866 2.9× 181 0.9× 362 1.9× 95 1.3k
P. Bayer Germany 17 1.1k 1.5× 464 1.0× 216 0.7× 294 1.5× 186 1.0× 18 1.3k
W. van Haeringen Netherlands 22 807 1.1× 583 1.3× 217 0.7× 126 0.6× 353 1.8× 62 1.3k
R. F. Broom Switzerland 21 790 1.1× 776 1.7× 717 2.4× 154 0.8× 264 1.4× 59 1.5k
H. Weinstock United States 15 354 0.5× 167 0.4× 294 1.0× 170 0.9× 192 1.0× 44 827
U. Gambardella Italy 20 298 0.4× 362 0.8× 804 2.7× 327 1.7× 315 1.6× 135 1.3k
Yasunori Tokuda Japan 21 657 0.9× 1.1k 2.3× 526 1.8× 465 2.3× 257 1.3× 130 1.6k
H. Notarys United States 13 787 1.1× 198 0.4× 412 1.4× 405 2.0× 133 0.7× 34 932
J. Caro Netherlands 17 943 1.3× 816 1.8× 122 0.4× 98 0.5× 201 1.0× 69 1.3k
J. P. Nibarger United States 16 1.3k 1.8× 379 0.8× 156 0.5× 430 2.2× 155 0.8× 24 1.6k

Countries citing papers authored by A. H. Verbruggen

Since Specialization
Citations

This map shows the geographic impact of A. H. Verbruggen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. H. Verbruggen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. H. Verbruggen more than expected).

Fields of papers citing papers by A. H. Verbruggen

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. H. Verbruggen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. H. Verbruggen. The network helps show where A. H. Verbruggen may publish in the future.

Co-authorship network of co-authors of A. H. Verbruggen

This figure shows the co-authorship network connecting the top 25 collaborators of A. H. Verbruggen. A scholar is included among the top collaborators of A. H. Verbruggen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. H. Verbruggen. A. H. Verbruggen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Mooij, J. E., Gerd Schön, Alexander Shnirman, et al.. (2015). Superconductor–insulator transition in nanowires and nanowire arrays. New Journal of Physics. 17(3). 33006–33006. 30 indexed citations
2.
Verbruggen, A. H., et al.. (2002). Transient creep in free-standing thin polycrystalline aluminum films. Journal of Applied Physics. 92(9). 4968–4975. 15 indexed citations
3.
Verbruggen, A. H., et al.. (2002). High-temperature tensile tests and activation volume measurement of free-standing submicron Al films. Journal of Applied Physics. 92(11). 6612–6615. 15 indexed citations
4.
Verbruggen, A. H., T. M. Klapwijk, Wolfgang Belzig, & Jianrong Gao. (2001). The Resistive Transition of an Aluminium Hot Electron Bolometer Mixer with Normal Metal Cooling Banks. Softwaretechnik-Trends. 42. 3 indexed citations
5.
Verbruggen, A. H., et al.. (2001). Young’s modulus measurements and grain boundary sliding in free-standing thin metal films. Applied Physics Letters. 78(18). 2673–2675. 86 indexed citations
6.
Verbruggen, A. H., et al.. (1999). Micron-sized Hall probes on a Si/SiGe heterostructure as a tool to study vortex dynamics in high-temperature superconducting crystals. Review of Scientific Instruments. 70(3). 1767–1770. 5 indexed citations
7.
Verbruggen, A. H., et al.. (1999). Stress relaxation and creep in free-standing thin Al films studied using a bulge tester. AIP conference proceedings. 265–270. 3 indexed citations
8.
Homberg, Marc van den, A. H. Verbruggen, P.F.A. Alkemade, et al.. (1998). 1/fnoise in mono- and polycrystalline aluminum. Physical review. B, Condensed matter. 57(1). 53–55. 17 indexed citations
9.
Verbruggen, A. H., et al.. (1997). Electromigration in Short Al Lines Studied by High-Resolution Resistance Measurement. MRS Proceedings. 473. 6 indexed citations
10.
11.
Verbruggen, A. H., et al.. (1995). Fabrication of single-crystalline aluminum nanostructures. Microelectronic Engineering. 27(1-4). 117–120. 2 indexed citations
12.
Кузнецов, В. И., et al.. (1995). Technology for high-performance n-channel SiGe modulation-doped field-effect transistors. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 13(6). 2892–2896. 10 indexed citations
13.
Frank, W., et al.. (1994). Irradiation-induced defects in thin aluminium films studied by 1/f noise. physica status solidi (a). 146(1). 325–335. 12 indexed citations
14.
Cheung, Rebecca, L.J. Geerligs, J. Caro, et al.. (1994). Weak localisation and correlation effects in a two dimensional hole gas in Si/Si1−xGex heterostructures. Physica B Condensed Matter. 194-196. 1225–1226. 2 indexed citations
15.
Webster, M. N., et al.. (1993). Optimization of submicron microwave transistors by lateral scaling. European Solid-State Device Research Conference. 129–132. 1 indexed citations
16.
Verbruggen, A. H., et al.. (1993). Comparison Between I/F Noise, High-Resolution Resistometric, and Lifetime Electromigration Studies of AL and AL(SI). MRS Proceedings. 309. 5 indexed citations
17.
Verbruggen, A. H., Hermann Stoll, K. Heeck, & R. H. Koch. (1989). A novel technique for measuring resistance fluctuations independently of background noise. Applied Physics A. 48(3). 233–236. 35 indexed citations
18.
Verbruggen, A. H., et al.. (1989). Selective Chemical Vapour Deposition of Tungsten Using SiH4/WF6 Chemistry. MRS Proceedings. 168. 1 indexed citations
19.
Geerligs, L.J., et al.. (1989). Charging effects and quantum coherence in regular Josephson junction arrays. Physical Review Letters. 63(3). 326–329. 182 indexed citations
20.
Verbruggen, A. H., R. Griessen, & J. H. Rector. (1984). Hall Voltage Induced by Hydrogen Diffusion in Palladium. Physical Review Letters. 52(18). 1625–1628. 26 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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