A. C. F. Hoole

600 total citations
13 papers, 464 citations indexed

About

A. C. F. Hoole is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, A. C. F. Hoole has authored 13 papers receiving a total of 464 indexed citations (citations by other indexed papers that have themselves been cited), including 11 papers in Electrical and Electronic Engineering, 6 papers in Atomic and Molecular Physics, and Optics and 6 papers in Biomedical Engineering. Recurrent topics in A. C. F. Hoole's work include Integrated Circuits and Semiconductor Failure Analysis (6 papers), Semiconductor materials and devices (4 papers) and Force Microscopy Techniques and Applications (3 papers). A. C. F. Hoole is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (6 papers), Semiconductor materials and devices (4 papers) and Force Microscopy Techniques and Applications (3 papers). A. C. F. Hoole collaborates with scholars based in United Kingdom, Switzerland and South Sudan. A. C. F. Hoole's co-authors include A. N. Broers, Mark E. Welland, Joseph M. Ryan, S. J. O’Shea, Mark A. Lantz, Mark C. Hersam, Hans A. Biebuyck, Bruno Michel, David F. Moore and Emmanuel Delamarche and has published in prestigious journals such as Applied Physics Letters, The Journal of Physical Chemistry B and Semiconductor Science and Technology.

In The Last Decade

A. C. F. Hoole

13 papers receiving 440 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
A. C. F. Hoole United Kingdom	8	248	225	192	93	68	13	464
Sylvain Hudlet France	11	317 1.3×	476 2.1×	352 1.8×	120 1.3×	35 0.5×	15	637
Paul E. West United States	9	127 0.5×	190 0.8×	158 0.8×	151 1.6×	37 0.5×	12	368
Masatoshi Yasutake Japan	12	179 0.7×	365 1.6×	197 1.0×	122 1.3×	27 0.4×	33	465
S. Iraj Najafi Canada	11	414 1.7×	273 1.2×	83 0.4×	123 1.3×	21 0.3×	56	592
T. Meziani Italy	9	201 0.8×	78 0.3×	178 0.9×	82 0.9×	87 1.3×	11	380
G. J. Pietsch Germany	12	394 1.6×	340 1.5×	277 1.4×	294 3.2×	36 0.5×	17	663
Peter Güthner Germany	8	148 0.6×	279 1.2×	291 1.5×	209 2.2×	40 0.6×	12	464
John J. Steele Canada	9	333 1.3×	136 0.6×	184 1.0×	131 1.4×	46 0.7×	14	537
J. P. Carrejo United States	7	169 0.7×	277 1.2×	209 1.1×	153 1.6×	66 1.0×	11	424
M. A. Blauw Netherlands	14	597 2.4×	98 0.4×	171 0.9×	181 1.9×	117 1.7×	32	678

Countries citing papers authored by A. C. F. Hoole

Since Specialization

Citations

This map shows the geographic impact of A. C. F. Hoole's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. C. F. Hoole with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. C. F. Hoole more than expected).

Fields of papers citing papers by A. C. F. Hoole

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. C. F. Hoole. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. C. F. Hoole. The network helps show where A. C. F. Hoole may publish in the future.

Co-authorship network of co-authors of A. C. F. Hoole

This figure shows the co-authorship network connecting the top 25 collaborators of A. C. F. Hoole. A scholar is included among the top collaborators of A. C. F. Hoole based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. C. F. Hoole. A. C. F. Hoole is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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13 of 13 papers shown

Hersam, Mark C., A. C. F. Hoole, S. J. O’Shea, & Mark E. Welland. (1998). Potentiometry and repair of electrically stressed nanowires using atomic force microscopy. Applied Physics Letters. 72(8). 915–917. 44 indexed citations

Delamarche, Emmanuel, A. C. F. Hoole, Bruno Michel, et al.. (1997). Making Gold Nanostructures Using Self-Assembled Monolayers and a Scanning Tunneling Microscope. The Journal of Physical Chemistry B. 101(45). 9263–9269. 23 indexed citations

Hoole, A. C. F., Mark E. Welland, & A. N. Broers. (1997). Negative PMMA as a high-resolution resist - the limits and possibilities. Semiconductor Science and Technology. 12(9). 1166–1170. 64 indexed citations

Lantz, Mark A., S. J. O’Shea, A. C. F. Hoole, & Mark E. Welland. (1997). Lateral stiffness of the tip and tip-sample contact in frictional force microscopy. Applied Physics Letters. 70(8). 970–972. 124 indexed citations

Broers, A. N., A. C. F. Hoole, & Joseph M. Ryan. (1996). Electron beam lithography—Resolution limits. Microelectronic Engineering. 32(1-4). 131–142. 155 indexed citations

Hoole, A. C. F. & A. N. Broers. (1996). A novel technique for the fabrication of sub-20nm metallic wires. Microelectronic Engineering. 30(1-4). 467–470. 1 indexed citations

Ryan, Joseph M., A. C. F. Hoole, & A. N. Broers. (1995). A study of the effect of ultrasonic agitation during development of poly(methylmethacrylate) for ultrahigh resolution electron-beam lithography. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 13(6). 3035–3039. 17 indexed citations

Barnes, J. R., A. C. F. Hoole, M. P. Murrell, et al.. (1995). Characterization of electron beam induced modification of thermally grown SiO2. Applied Physics Letters. 67(11). 1538–1540. 13 indexed citations

Hoole, A. C. F., et al.. (1993). Integrated nanofabrication with the scanning electron microscope and scanning tunneling microscope. Applied Physics Letters. 63(17). 2435–2437. 8 indexed citations

10.

Moore, David F., M. I. Lutwyche, & A. C. F. Hoole. (1993). Fabrication of freestanding structures and proposed applications in tunneling sensors. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 11(6). 2548–2551. 5 indexed citations

11.

Hove, M. Van, Guangtian Zou, W. De Raedt, et al.. (1993). Scaling behavior of delta-doped AlGaAs/InGaAs high electron mobility transistors with gatelengths down to 60 nm and source-drain gaps down to 230 nm. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 11(4). 1203–1208. 2 indexed citations

12.

Hoole, A. C. F., David F. Moore, & A. N. Broers. (1993). Directly patterned low voltage planar tungsten lateral field emission structures. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 11(6). 2574–2578. 3 indexed citations

13.

Hoole, A. C. F. & A. N. Broers. (1992). Etch-rate characterization of irradiated SiO2 and its application in the fabrication of a T-gate structure. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 10(6). 2855–2859. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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