W. Ting

New Approaches to Nanofabrication:  Molding, Printing, and Other Techniques

Interface-state generation under radiation and high-field stressing in reoxidized nitrided oxide MOS capacitors

Minimax approach to accelerated life tests

Automatic control in microelectronics manufacturing: Practices, challenges, and possibilities

Bibliographical review on reconfigurable fault-tolerant control systems

Optimum Accelerated Life Tests Wth a Nonconstant Scale Parameter

Modification of hydrogen-passivated silicon by a scanning tunneling microscope operating in air

Radiation Effects in MOS Oxides

Effects of post-nitridation anneals on radiation hardness in rapid thermal nitrided gate oxides

Ultrathin stacked Si₃N₄/SiO₂gate dielectrics prepared by rapid thermal processing

Time-dependent dielectric breakdown of chemical-vapour-deposited SiO ₃ gate dielectrics

Electrical characteristics of reoxidized-nitrided chemical vapor deposited oxides