V. Arnal

Low trap-state density and long carrier diffusion in organolead trihalide perovskite single crystals

In-memory computing with resistive switching devices

Adsorption mechanisms of fluorocarbon polymers at ultra low-k surfaces

Reliability Impact of Chalcogenide-Structure Relaxation in Phase-Change Memory (PCM) Cells—Part I: Experimental Study

Characterization and integration of a CVD porous SiOCH (k<2.5) with enhanced mechanical properties for 65 nm CMOS interconnects and below

Bias-stress-induced evolution of the dielectric properties of porous-ULK/ copper advanced interconnects