U. Lambert

Life‐cycle assessment of photovoltaic modules: Comparison of mc‐Si, InGaP and InGaP/mc‐Si solar modules

Luminescence nanothermometry

Luminescent probes and sensors for temperature

History and progress in the accurate determination of the Avogadro constant

Nanoparticles for photothermal therapies

Infrared thermography for condition monitoring – A review

Increased lateral oxidation rates of AllnAs on InP using short-period superlattices

Device Characteristics of CZTSSe Thin‐Film Solar Cells with 12.6% Efficiency

Rare earth elements: A review of applications, occurrence, exploration, analysis, recycling, and environmental impact

State-of-the-art in inorganic mass spectrometry for analysis of high-purity materials

Lateral oxidation of InAlAs in InP-based heterostructures for long wavelength vertical cavity surface emitting laser applications

About the existing discrepancy in the determinations of the Avogadro constant

Assessment of sustainability indicators for renewable energy technologies

Electronic properties of CuGaSe2-based heterojunction solar cells. Part I. Transport analysis

CODATA recommended values of the fundamental physical constants: 2010

Open-Circuit Voltage Deficit, Radiative Sub-Bandgap States, and Prospects in Quantum Dot Solar Cells

Life cycle assessment of thin‐film GaAs and GaInP/GaAs solar modules

The molar volume of silicon: discrepancies and limitations

Radiofrequency spark source mass spectrometric analysis of oxygen in undoped silicon crystals and of carbon in undoped and carbon doped gallium arsenide crystals

Internal oxidation of vacancy agglomerates in Czochralski silicon wafers during high-temperature anneals

Measurement, modelling and simulation of defects in as-grown Czochralski silicon

Advanced arsenic purification and GaAs synthesis for improved reproducible growth of undoped semi-insulating GaAs

Localization of gate oxide integrity defects in silicon metal-oxide-semiconductor structures with lock-in IR thermography

Defects in AS-Grown Silicon and their Evolution During Heat Treatments

Lock-In IR-Thermography – A Novel Tool for Material and Device Characterization