T.L. Turflinger

The effects of aging on MOS irradiation and annealing response

Radiation-induced soft errors in advanced semiconductor technologies

Elimination of Enhanced Low-Dose-Rate Sensitivity in Linear Bipolar Devices Using Silicon-Carbide Passivation

Basic mechanisms and modeling of single-event upset in digital microelectronics

Function composites materials for shielding applications: Correlation between phase separation and attenuation properties

Effects of device aging on microelectronics radiation response and reliability

Total ionizing dose effects in MOS oxides and devices

Comparison of error rates in combinational and sequential logic

Research of the shielding effect and radiation resistance of composite CuBi2O4 films as well as their practical applications

Effects of hydrogen transport and reactions on microelectronics radiation response and reliability

Total ionizing dose effects in bipolar devices and circuits

Characterization of enhanced low dose rate sensitivity (ELDRS) effects using Gated Lateral PNP transistor structures

Nature of Interface Defect Buildup in Gated Bipolar Devices Under Low Dose Rate Irradiation

Passivation layers for reduced total dose effects and ELDRS in linear bipolar devices

Thermal-stress effects and enhanced low dose rate sensitivity in linear bipolar ICs

Radiation Effects in MOS Oxides

Evaluation of proposed hardness assurance method for bipolar linear circuits with enhanced low dose rate sensitivity (ELDRS)

Identification of degradation mechanisms in a bipolar linear voltage comparator through correlation of transistor and circuit response

Enhanced low dose rate sensitivity (ELDRS) of linear circuits in a space environment

A proposed hardness assurance test methodology for bipolar linear circuits and devices in a space ionizing radiation environment

Origins of total-dose response variability in linear bipolar microcircuits

Heavy ion-induced digital single-event transients in deep submicron Processes

Understanding single event phenomena in complex analog and digital integrated circuits

Total-dose hardening of a bipolar-voltage comparator

Hardness assurance implications of bimodal total dose response in a bipolar linear voltage comparator

First observations of enhanced low dose rate sensitivity (ELDRS) in space: One part of the MPTB experiment