Citation Impact
Citing Papers
Pressure-sensitive properties and microstructure of carbon nanotube reinforced cement composites
2007 Standout
Optical gain in silicon nanocrystals
2000 StandoutNature
Optical crosstalk in single photon avalanche diode arrays: a new complete model
2008
Quantum Metrology with a Scanning Probe Atom Interferometer
2013
Radiation-induced soft errors in advanced semiconductor technologies
2005 Standout
Laser probing of bipolar amplification in 0.25-/spl mu/m MOS/SOI transistors
2000
Impact of technology trends on SEU in CMOS SRAMs
1996
Total dose failures in advanced electronics from single ions
1993
Implications of the spatial dependence of the single-event-upset threshold in SRAMs measured with a pulsed laser
1994
Basic mechanisms and modeling of single-event upset in digital microelectronics
2003 Standout
SEU-hardened resistive-load static RAMs
1991
Total dose induced latch in short channel NMOS/SOI transistors
1998
Validity: Meaning and Relevancy in Assessment for Engineering Education Research
2015
Total ionizing dose effects in MOS oxides and devices
2003 Standout
Single-event effects in SOI technologies and devices
1996
Temporal analysis of SEU in SOI/GAA SRAMs
1995
Experimental and simulation study of the effects of cosmic particles on CMOS/SOS RAMs
1990
Analysis of single-event effects in combinational logic-simulation of the AM2901 bitslice processor
2000
Critical charge concepts for CMOS SRAMs
1995
State of Qualitative Research in Engineering Education: Meta‐Analysis of JEE Articles, 2005–2006
2008 Standout
Inorganic nanoparticles in porous coordination polymers
2016 StandoutNobel
Cosmic and terrestrial single-event radiation effects in dynamic random access memories
1996
Single-event upset and snapback in silicon-on-insulator devices and integrated circuits
2000
Heavy ion-induced digital single-event transients in deep submicron Processes
2004
Single-photon detectors for optical quantum information applications
2009 Standout
Analysis of multiple bit upsets (MBU) in CMOS SRAM
1996
SEU critical charge and sensitive area in a submicron CMOS technology
1997
Analysis of the influence of MOS device geometry on predicted SEU cross sections
1999
Quantum sensing
2017 Standout
Porous silicon: a quantum sponge structure for silicon based optoelectronics
2000
Charge collection and SEU from angled ion strikes
1997
Single particle-induced latchup
1996
BUSFET-a radiation-hardened SOI transistor
1999
Effects of hydrogen transport and reactions on microelectronics radiation response and reliability
2002
Three-dimensional numerical simulation of single event upset of an SRAM cell
1993
RETROSPECTIVE REPORTS IN ORGANIZATIONAL RESEARCH: A REEXAMINATION OF RECENT EVIDENCE.
1997 Standout
An SEU resistant 256 K SOI SRAM
1992
Comparison of experimental charge collection waveforms with PISCES calculations
1991
Comparison of the sensitivity to heavy ions of SRAM's in different SIMOX technologies
1994
Device simulation of charge collection and single-event upset
1996
3-D ICs: a novel chip design for improving deep-submicrometer interconnect performance and systems-on-chip integration
2001 Standout
Single event mirroring and DRAM sense amplifier designs for improved single-event-upset performance
1994
Advances in solid state photon detectors
2009
Attenuation of single event induced pulses in CMOS combinational logic
1997
Electron field emission from carbon nanotubes and undoped nano-diamond
2003
SOI for digital CMOS VLSI: design considerations and advances
1998
Analysis of Hot-Carrier Luminescence for Infrared Single-Photon Upconversion and Readout
2007
Radiation effects in SOI technologies
2003
Radiation Effects in MOS Oxides
2008 Standout
Conducting Rigorous Research in Engineering Education
2006
Invited Review Article: Single-photon sources and detectors
2011 Standout
Upset hardened memory design for submicron CMOS technology
1996 Standout
Radiation effects in advanced microelectronics technologies
1998
Works of S.E. Kerns being referenced
Single-event-induced charge collection and direct channel conduction in submicron MOSFETs
1994
The design of radiation-hardened ICs for space: a compendium of approaches
1988
Simulation of SEU transients in CMOS ICs
1991
A Novel CMOS SRAM Feedback Element for SEU Environments
1987
Single-event charge enhancement in SOI devices
1990
Comparison of Contactless Measurement and Testing Techniques to a New All-Silicon Optical Test and Characterization Method
2005
Recent development of diamond microtip field emitter cathodes and devices
2001
Body tie placement in CMOS/SOI digital circuits for transient radiation environments
1991
Effects of process parameter distributions and ion strike locations on SEU cross-section data (CMOS SRAMs)
1993
Low temperature proton induced upsets in NMOS resistive load static RAM
1988
Keeping Us on the Same Page
2005
Total-dose radiation-hard diamond-based hydrogen sensor
1998
Simulation of design dependent failure exposure levels for CMOS ICs
1990
Analysis of electroluminescence spectra of silicon and gallium arsenide p–n junctions in avalanche breakdown
2004
Photon generation by silicon diodes in avalanche breakdown
1998
Model for CMOS/SOI single-event vulnerability
1989
A multimechanism model for photon generation by silicon junctions in avalanche breakdown
1999