Immediate Impact
3 standout
Citing Papers
Radiation Effects in MOS Oxides
2008 Standout
Radiation-induced soft errors in advanced semiconductor technologies
2005 Standout
Works of S.D. Kniffin being referenced
Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future
2003
Author Peers
| Author | Last Decade | Papers | Cites | |||||
|---|---|---|---|---|---|---|---|---|
| S.D. Kniffin | 82 | 4 | 7 | 14 | 13 | 9 | 86 | |
| David M. Hiemstra | 76 | 2 | 5 | 16 | 21 | 6 | 81 | |
| S. Crain | 77 | 1 | 3 | 34 | 9 | 8 | 80 | |
| D. David | 94 | 2 | 3 | 15 | 21 | 6 | 105 | |
| Vasily S. Anashin | 61 | 2 | 7 | 16 | 12 | 14 | 68 | |
| H. R. Schwartz | 169 | 4 | 5 | 41 | 12 | 11 | 174 | |
| Tim Edwards | 69 | 1 | 9 | 19 | 8 | 8 | 85 | |
| John McGrath | 52 | 15 | 7 | 35 | 12 | 114 | ||
| S.H. Penzin | 128 | 6 | 5 | 62 | 10 | 6 | 132 | |
| S. Doyle | 208 | 4 | 6 | 81 | 20 | 5 | 210 | |
| Jesús Tabero | 31 | 2 | 6 | 18 | 32 | 11 | 67 |
All Works
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