Immediate Impact
2 standout
Citing Papers
Radiation-induced soft errors in advanced semiconductor technologies
2005 Standout
Basic mechanisms and modeling of single-event upset in digital microelectronics
2003 Standout
Works of S. Wu being referenced
Total-dose and SEU characterization of 0.25 micron CMOS/SOI integrated circuit memory technologies
1997
Author Peers
| Author | Last Decade | Papers | Cites | ||||
|---|---|---|---|---|---|---|---|
| S. Wu | 177 | 26 | 7 | 20 | 6 | 181 | |
| Hiroki Asada | 156 | 20 | 9 | 13 | 8 | 184 | |
| Brendan Farley | 74 | 24 | 8 | 15 | 6 | 88 | |
| Q. Huang | 142 | 53 | 5 | 5 | 10 | 158 | |
| Philip A. Godoy | 176 | 13 | 3 | 10 | 8 | 177 | |
| P. Wambacq | 125 | 29 | 6 | 20 | 6 | 127 | |
| Kaushik Dasgupta | 161 | 19 | 7 | 23 | 10 | 170 | |
| Tadahiro Kuroda | 123 | 56 | 10 | 15 | 6 | 144 | |
| Akshay Visweswaran | 187 | 38 | 16 | 53 | 9 | 199 | |
| S. Minehane | 209 | 17 | 12 | 12 | 9 | 222 | |
| D. Forehand | 150 | 17 | 6 | 32 | 8 | 157 |
All Works
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