Citation Impact
1 standout
Citing Papers
Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors
2008 Standout
Works of S. Willard being referenced
New degradation mechanism associated with hydrogen in bipolar transistors under hot carrier stress
1993
Author Peers
| Author | EEE | NHEP | Radiation | Last Decade | Papers | Cites |
|---|---|---|---|---|---|---|
| S. Willard | 38 | 20 | 11 | 4 | 42 | |
| Leon C. Boyd | 1 | 12 | 462 | |||
| Michael A. Gurdon | 6 | 14 | 9.8k | |||
| Junko Kusumi | 40 | 499 | ||||
| Chuanyin Liu | 317 | 23 | 481 | |||
| Daniel Armeanu | 38 | 26 | 667 |
All Works
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