Citation Impact
Citing Papers
Intrinsic and extrinsic performance limits of graphene devices on SiO2
2008 Standout
The structure and properties of metal-semiconductor interfaces
1982
SEU simulation and testing of resistor-hardened D-latches in the SA3300 microprocessor
1991
Radiation-induced soft errors in advanced semiconductor technologies
2005 Standout
Impact of technology trends on SEU in CMOS SRAMs
1996
Interface chemistry of ternary semiconductors: Local morphology of theHg 1 − x Cd x
1985
Effect of different cation-anion bond strengths on metal–ternary-semiconductor interface formation: Cu/Hg 0.75 Cd 0.25
1986 StandoutNobel
Basic mechanisms and modeling of single-event upset in digital microelectronics
2003 Standout
Antimonide-based compound semiconductors for electronic devices: A review
2005
Diffusion of Ag and Hg at the Ag/(Hg, Cd)Te interface
1986 StandoutNobel
Inelastic light scattering spectroscopy of a multilayer two-dimensional electron gas
1980 StandoutNobel
Inelastic light scattering by charge carrier excitations in two-dimensional plasmas: Theoretical considerations
1980
Electric currents through ion tracks in silicon devices
1998
Second-order Raman scattering in InAs
1980
Resonance enhancement of Raman scattering by electron-gas excitations of n-GaAs
1979
Total ionizing dose effects in MOS oxides and devices
2003 Standout
Spontaneous Light Emission Assisted by Mie Resonances in Diamond Nanoparticles
2021 StandoutNobel
SEU-hardened storage cell validation using a pulsed laser
1996
Metal–Organic Framework Materials as Chemical Sensors
2011 Standout
Nonlinear Fano-Resonant Dielectric Metasurfaces
2015
Enhanced Third-Harmonic Generation in Silicon Nanoparticles Driven by Magnetic Response
2014
Advanced Thermoelectric Design: From Materials and Structures to Devices
2020 Standout
Analysis of single-event effects in combinational logic-simulation of the AM2901 bitslice processor
2000
Implementing QML for radiation hardness assurance
1990
Band Bending in Semiconductors: Chemical and Physical Consequences at Surfaces and Interfaces
2012 Standout
Critical charge concepts for CMOS SRAMs
1995
Noble-metal–CdTe interface formation
1988 StandoutNobel
Single-event upset and snapback in silicon-on-insulator devices and integrated circuits
2000
One-Dimensional Electrical Contact to a Two-Dimensional Material
2013 StandoutScience
Intrinsic infrared detectors
1988
A comparison of SEU tolerance in high-speed SiGe HBT digital logic designed with multiple circuit architectures
2002
Millimeter-Wave Technology for Automotive Radar Sensors in the 77 GHz Frequency Band
2012 Standout
Microbeam studies of single-event effects
1996
Three-dimensional numerical simulation of single event upset of an SRAM cell
1993
MEMS reliability from a failure mechanisms perspective
2003
Overlayer-cation reaction at the Pt/Hg_{1-x}Cd_{x}Te interface
1987 StandoutNobel
Interactions between cleaved (Hg,Cd)Te surfaces and deposited overlayers of Al and In
1985
Observation of intersubband excitations in a multilayer two dimensional electron gas
1979 StandoutNobel
Device simulation of charge collection and single-event upset
1996
Passivation layers for reduced total dose effects and ELDRS in linear bipolar devices
2003
Three-dimensional simulation of charge collection and multiple-bit upset in Si devices
1994
Infrared detectors: status and trends
2003 Standout
A magnetorheological fluid embedded pneumatic vibration isolator allowing independently adjustable stiffness and damping
2011
Chemical and Electrical Mechanisms in Titanium, Platinum, and Hafnium Contacts to Alpha (6H) Silicon Carbide
1992 StandoutNobel
Impact of scaling on soft-error rates in commercial microprocessors
2002
Changes in the local chemical composition during the Hg1−xCdxTe-Al interface formation
1983
Bismuth Telluride (Bi2Te3) Nanowires: Synthesis by Cyclic Electrodeposition/Stripping, Thinning by Electrooxidation, and Electrical Power Generation
2006
Radiation effects in SOI technologies
2003
Radiation Effects in MOS Oxides
2008 Standout
Electronic properties of junctions between silicon and organic conducting polymers
1990 StandoutNatureNobel
Destructive single-event effects in semiconductor devices and ICs
2003
Quality of AlAs-like and InSb-like interfaces in InAs/AlSb superlattices: An optical study
1993 StandoutNobel
Electronic structure of the Yb/Ge(111) interface
1986 StandoutNobel
Magnetorheological fluid dampers: A review on structure design and analysis
2012 Standout
SEU-sensitive volumes in bulk and SOI SRAMs from first-principles calculations and experiments
2001
Optically resonant dielectric nanostructures
2016 StandoutScience
On the Potential of SiGe HBTs for Extreme Environment Electronics
2005
Electronic properties of two-dimensional systems
1982 Standout
Upset hardened memory design for submicron CMOS technology
1996 Standout
Radiation effects in advanced microelectronics technologies
1998
Works of S. Büchner being referenced
Raman Scattering by Wave-Vector—Dependent LO-Phonon—Plasmon Modes inn
1974
Single event effects in circuit-hardened SiGe HBT logic at gigabit per second data rates
2000
Laser probing of bipolar amplification in 0.25-/spl mu/m MOS/SOI transistors
2000
Subbandgap laser-induced single event effects: carrier generation via two-photon absorption
2002
Ion induced charge collection in GaAs MESFETs
1989
Implications of the spatial dependence of the single-event-upset threshold in SRAMs measured with a pulsed laser
1994
A digital CMOS design technique for SEU hardening
2000
<title>Self-contained active damping system for pneumatic isolation tables</title>
2000
Laser simulation of single-event upset in a p-well CMOS counter
1989
Evidence for angular effects in proton-induced single-event upsets
2002
Oxide and interface properties of anodic films on Hg1−xCdxTe
1980
Schottky barrier formation on (Pb,Sn)Te
1979
Oxygen uptake on an epitaxial PbSnTe(111) surface
1978
Laser Simulation of Single Event Upsets
1987
SEU characterization and design dependence of the SA3300 microprocessor
1990
Comparison of error rates in combinational and sequential logic
1997
Analysis of multiple bit upsets (MBU) in CMOS SRAM
1996
Charge-collection characteristics of low-power ultrahigh speed, metamorphic AlSb/InAs high-electron mobility transistors (HEMTs)
2000
Laboratory tests for single-event effects
1996
Use of surface behavior diagrams to compare anodic and photochemical oxides of Hg0.8Cd0.2Te
1983
Pulsed laser-induced SEU in integrated circuits: a practical method for hardness assurance testing
1990
Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies
1994
Attenuation of single event induced pulses in CMOS combinational logic
1997
Spatial and temporal dependence of SEU in a 64 K SRAM
1992
Investigations of single-event upsets and charge collection in micro-electronics using variable-length laser-generated charge tracks
1998
Charge-collection dynamics of AlSb-InAs-GaSb resonant interband tunneling diodes (RITDs) [for MOBILE logic circuits]
2001
Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future
2003
Charge collection from focussed picosecond laser pulses
1988
Raman scattering at the (111) and (1 ¯ 1 ¯ 1 ¯ n p − InAs
1976
Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation
2002
The effects of radiation on MEMS accelerometers
1996
Anodic oxide composition and Hg depletion at the oxide–semiconductor interface of Hg1−xCdxTe
1981