Immediate Impact
19 standout
Citing Papers
Stability, Reliability, and Robustness of GaN Power Devices: A Review
2023 Standout
Transistors based on two-dimensional materials for future integrated circuits
2021 Standout
Works of Pushkar P. Apte being referenced
Correlation of trap generation to charge-to-breakdown (Q/sub bd/): a physical-damage model of dielectric breakdown
1994
SiO/sub 2/ degradation with charge injection polarity
1993
Author Peers
| Author | Last Decade | Papers | Cites | ||||
|---|---|---|---|---|---|---|---|
| Pushkar P. Apte | 267 | 107 | 28 | 88 | 19 | 326 | |
| Bhanwar Singh | 240 | 101 | 22 | 148 | 37 | 365 | |
| Jianzheng Hu | 222 | 66 | 24 | 56 | 13 | 331 | |
| M A Shulman | 133 | 79 | 33 | 64 | 11 | 262 | |
| Dae-gil Kim | 165 | 102 | 21 | 40 | 27 | 283 | |
| Mehrdad M. Moslehi | 233 | 27 | 20 | 71 | 24 | 289 | |
| Nina Vaidya | 144 | 46 | 32 | 31 | 26 | 289 | |
| Xiaocong Wang | 133 | 81 | 45 | 26 | 29 | 294 | |
| Kazuyoshi Sugihara | 212 | 63 | 19 | 42 | 36 | 293 | |
| Xiaojing Wang | 161 | 43 | 11 | 119 | 21 | 268 | |
| Wilkin Tang | 206 | 126 | 26 | 110 | 19 | 304 |
All Works
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