Citation Impact
Citing Papers
Oxide scaling limit for future logic and memory technology
1999
Flash memory cells-an overview
1997
Fundamentals of Modern VLSI Devices
2009 Standout
Ultrathin gate oxide reliability: physical models, statistics, and characterization
2002
High-κ gate dielectrics: Current status and materials properties considerations
2001 Standout
Works of P. Mortini being referenced
Dielectric reliability in deep-submicron technologies: From thin to ultrathin oxides
1997
New method for the extraction of the coupling ratios in FLOTOX EEPROM cells
1993