Citation Impact
Citing Papers
Radiation-induced soft errors in advanced semiconductor technologies
2005 Standout
Laser probing of bipolar amplification in 0.25-/spl mu/m MOS/SOI transistors
2000
Impact of technology trends on SEU in CMOS SRAMs
1996
Total dose failures in advanced electronics from single ions
1993
A review of Ga2O3 materials, processing, and devices
2018 Standout
Basic mechanisms and modeling of single-event upset in digital microelectronics
2003 Standout
Review—Ionizing Radiation Damage Effects on GaN Devices
2015
SEU-hardened resistive-load static RAMs
1991
Total dose induced latch in short channel NMOS/SOI transistors
1998
Total ionizing dose effects in MOS oxides and devices
2003 Standout
Single-event effects in SOI technologies and devices
1996
Temporal analysis of SEU in SOI/GAA SRAMs
1995
Experimental and simulation study of the effects of cosmic particles on CMOS/SOS RAMs
1990
Critical charge concepts for CMOS SRAMs
1995
Cosmic and terrestrial single-event radiation effects in dynamic random access memories
1996
Single-event upset and snapback in silicon-on-insulator devices and integrated circuits
2000
The future of electronics based on memristive systems
2017 Standout
SEU critical charge and sensitive area in a submicron CMOS technology
1997
Analysis of the influence of MOS device geometry on predicted SEU cross sections
1999
BUSFET-a radiation-hardened SOI transistor
1999
Physical unclonable functions
2020 Standout
An SEU resistant 256 K SOI SRAM
1992
The Predictive Audit Framework
2013
Comparison of the sensitivity to heavy ions of SRAM's in different SIMOX technologies
1994
Device simulation of charge collection and single-event upset
1996
3-D ICs: a novel chip design for improving deep-submicrometer interconnect performance and systems-on-chip integration
2001 Standout
Emerging Memory Technologies: Recent Trends and Prospects
2016
SOI for digital CMOS VLSI: design considerations and advances
1998
Big Data in Accounting: An Overview
2015 Standout
Revised model of thermally stimulated current in MOS capacitors
1997
Radiation effects in SOI technologies
2003
Radiation Effects in MOS Oxides
2008 Standout
Works of Michael L. Alles being referenced
Single-event charge enhancement in SOI devices
1990
Thin film SOI emerges
1997
Radiation effects in new materials for nano-devices
2011
Body tie placement in CMOS/SOI digital circuits for transient radiation environments
1991
Remote Audit: A Research Framework
2010
Effects of process parameter distributions and ion strike locations on SEU cross-section data (CMOS SRAMs)
1993
SPICE analysis of the SEU sensitivity of a fully depleted SOI CMOS SRAM cell
1994
Model for CMOS/SOI single-event vulnerability
1989
Single- and Multiple-Event Induced Upsets in <formula formulatype="inline"><tex Notation="TeX">${\rm HfO}_2/{\rm Hf}$</tex></formula> 1T1R RRAM
2014