Mark Gesley

100-Fold Reduction of Electric-Field Noise in an Ion Trap Cleaned withIn SituArgon-Ion-Beam Bombardment

The development of field-emission scanning electron microscopy for imaging biological surfaces.

Adsorbed layer and thin film growth modes monitored by Auger electron spectroscopy

Atomic Layer Deposition: An Overview

Ion-trap measurements of electric-field noise near surfaces

Quantum sensing

Silver Nanoparticles: Synthesis, Characterization, Properties, Applications, and Therapeutic Approaches

Unconventional Methods for Fabricating and Patterning Nanostructures

Electron beam lithography for 0.13 μm manufacturing

X-ray lithography in IBM, 1980–1992, the development years

Fundamentals of Modern VLSI Devices

CMOS scaling into the 21st century: 0.1 µm and beyond

Experimental 0.1 mu m p-channel MOSFET with p/sup +/-polysilicon gate on 35 AA gate oxide

Modular production networks: a new American model of industrial organization

100 kV g h o s t electron beam proximity correction on tungsten x-ray masks

Spectral analysis of adsorbate induced field-emission flicker noise

Cesium and oxygen coadsorption on LaB6, single crystal surfaces

A vector-scan thermal-field emission nanolithography system

Current density distribution in a chromatically limited electron microprobe