M. Raine

Radiation-induced soft errors in advanced semiconductor technologies

Implications of the spatial dependence of the single-event-upset threshold in SRAMs measured with a pulsed laser

Basic mechanisms and modeling of single-event upset in digital microelectronics

Cosmic and terrestrial single-event radiation effects in dynamic random access memories

SEU Prediction From SET Modeling Using Multi-Node Collection in Bulk Transistors and SRAMs Down to the 65 nm Technology Node