Citation Impact
Citing Papers
Effects of interface traps and border traps on MOS postirradiation annealing response
1995
Basic mechanisms and modeling of single-event upset in digital microelectronics
2003 Standout
Total ionizing dose effects in MOS oxides and devices
2003 Standout
Voltage dependence of hard breakdown growth and the reliability implication in thin dielectrics
2002
Effects of hydrogen transport and reactions on microelectronics radiation response and reliability
2002
Fundamentals of Modern VLSI Devices
2009 Standout
Radiation Effects in MOS Oxides
2008 Standout
Successive Oxide Breakdown Statistics: Correlation Effects, Reliability Methodologies, and Their Limits
2004
A quadruple well, quadruple polysilicon BiCMOS process for fast 16 Mb SRAM's
1994
Works of M. Kerber being referenced
Soft breakdown and hard breakdown in ultra-thin oxides
2001
Direct observation of very slow traps after homogeneous charge injection in MOS capacitors
1990
Field-implant-free isolation by double-well split drive-in
1990
Energy distribution of slow trapping states in metal-oxide-semiconductor devices after Fowler–Nordheim injection
1993