M. Haond

Local Polar Fluctuations in Lead Halide Perovskite Crystals

Total ionizing dose effects in MOS oxides and devices

Determination of crystallographic orientations in silicon films by Raman-microprobe polarization measurements

Radiation effects in SOI technologies

Microanalysis of single-crystal Si recrystallized using halogen lamps

Electrical performances of devices made in SOI films obtained by lamp ZMR