Citation Impact
Citing Papers
Amorphous nickel hydroxide nanospheres with ultrahigh capacitance and energy density as electrochemical pseudocapacitor materials
2013 Standout
Quantum imaging with undetected photons
2014 StandoutNatureNobel
An ultra-lightweight design for imperceptible plastic electronics
2013 StandoutNature
Fast fabrication of long-range ordered porous alumina membranes by hard anodization
2006 Standout
Macroscopic polarization in crystalline dielectrics: the geometric phase approach
1994 Standout
Si-SiO2 interface characterization from angular dependence of x-ray photoelectron spectra
1980
Quantum Confinement in Size-Selected, Surface-Oxidized Silicon Nanocrystals
1993 StandoutScienceNobel
Raman scattering study of InAs/GaInSb strained layer superlattices
1991 StandoutNobel
Electrochemical and optical studies of thick oxide layers on iridium and their electrocatalytic activities for the oxygen evolution reaction
1978
Electrochemical formation of anodic oxide films on Nb surfaces: ellipsometric and Raman spectroscopical studies
2006
The anodic oxidation of superimposed metallic layers: theory
1980
Optical absorption of silicon between 1.6 and 4.7 eV at elevated temperatures
1982
New Approaches to Nanofabrication: Molding, Printing, and Other Techniques
2005 Standout
Solar Water Splitting Cells
2010 Standout
Crystalline Semiconducting Materials and Devices
1986
Chiroptical molecular switches
1996 StandoutNobel
A high-resolution electron microscopy study of the Si-SiO2 interface
1978 StandoutNobel
Dimensions of luminescent oxidized and porous silicon structures
1994 StandoutNobel
Point defects and dopant diffusion in silicon
1989 Standout
Chiroptical Molecular Switches 1; Principles and Syntheses
1992 StandoutNobel
Chiroptical Molecular Switches
2000 StandoutNobel
Thin anodic oxide layers on aluminium and other valve metals: high field regime
1993
In Situ Raman Studies on Cathodically Deposited Nickel Hydroxide Films and Electroless Ni−P Electrodes in 1 M KOH Solution
1998
Surface analysis during vapour phase growth
1980
Ein hoch stereoselektiver optischer Schaltprozeß auf der Basis von Donor‐Acceptor‐substituierten dissymetrischen Alkenen
1995 StandoutNobel
Numerical studies on the electro-optic detection of femtosecond electron bunches
2008 StandoutNobel
Optical characterization of wide bandgap semiconductors
2000 StandoutNobel
Nickel–Iron Oxyhydroxide Oxygen-Evolution Electrocatalysts: The Role of Intentional and Incidental Iron Incorporation
2014 Standout
Materialien für die optische Datenspeicherung
1989
Numerical Studies on the Electro-Optic Sampling of Relativistic Electron Bunches
2006 StandoutNobel
Microscopic structure of theSiO 2
1988 Standout
Nucleation and growth of thin films
1984 Standout
Unconventional Methods for Fabricating and Patterning Nanostructures
1999 Standout
LEED structure analysis of the clean and (2×1)H covered Pd(110) surface
1987 StandoutNobel
Physical and chemical properties of SiSiO2 transition regions
1980
Electron-hole excitations and optical spectra from first principles
2000 Standout
The modelling of silicon oxidation from 1 × 10−5 to 20 atmospheres
1987
Optical anisotropy in InAs/AlSb superlattices
1994 StandoutNobel
Size, shape, and composition of luminescent species in oxidized Si nanocrystals and H-passivated porous Si
1995 StandoutNobel
An XPS study of Si as it occurs in adsorbents, catalysts, and thin films
1983
Self-energy operators and exchange-correlation potentials in semiconductors
1988 Standout
Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50–2000 eV range
1994 Standout
Materials for Optical Data Storage
1989
A revised model for the oxidation of Si by oxygen
1978
Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV
1983 Standout
Optical properties of thin films
1982 Standout
SiSiO2 interface characterization by ESCA
1979
The thermal oxidation of silicon the special case of the growth of very thin films
1986
Recent Trends and Perspectives in Electrochemical Water Splitting with an Emphasis on Sulfide, Selenide, and Phosphide Catalysts of Fe, Co, and Ni: A Review
2016 Standout
Chemistry, microstructure, and electrical properties at interfaces between thin films of cobalt and alpha (6H) silicon carbide (0001)
1995 StandoutNobel
Spectroscopic ellipsometry and low-temperature reflectance: complementary analysis of GaN thin films
1998 StandoutNobel
Analysis of silicon crystal growth using low pressure chemical vapour deposition
1983
Energy Transfer from Quantum Dots to Graphene and MoS2: The Role of Absorption and Screening in Two-Dimensional Materials
2016 StandoutNobel
A Highly Stereoselective Optical Switching Process Based on Donor–Acceptor Substituted Dissymmetric Alkenes
1995 StandoutNobel
Oxygen evolution reaction on thick hydrous nickel oxide electrodes
1988
Determination of effective capacitance and film thickness from constant-phase-element parameters
2009 Standout
Solar Energy Supply and Storage for the Legacy and Nonlegacy Worlds
2010 Standout
Electronic properties of two-dimensional systems
1982 Standout
Chemistry, microstructure, and electrical properties at interfaces between thin films of titanium and alpha (6H) silicon carbide (0001)
1995 StandoutNobel
Porous Anodic Aluminum Oxide: Anodization and Templated Synthesis of Functional Nanostructures
2014 Standout
Works of M. A. Hopper being referenced
The Field-Dependence of the Dielectric Constant during the Anodic Oxidation of Tantalum, Niobium, and Tungsten
1972
Anodic Oxidation of Zirconium: Evidence of Typical Valve Metal Behavior
1977
An Optical Study of the Growth and Oxidation of Nickel Hydroxide Films
1973
Ablative optical recording using organic dye-in-polymer films
1980
Thermal Oxidation of Silicon: In Situ Measurement of the Growth Rate Using Ellipsometry
1975
Removal of oxide films from silicon surfaces in a high vacuum system: an in situ ellipsometric study
1976
The Anodic Oxidation of Platinum: Determining the Dependence of Current Density on Potential
1976
An ESCA Study of the Oxide at the Si ‐ SiO2 Interface
1975