Standout Papers

Photochemically generated silicon-carbon double-bonded intermediates. 10. Photochemical beha... 1979 2026 1994 2010 19
  1. Photochemically generated silicon-carbon double-bonded intermediates. 10. Photochemical behavior of 1-disilanyl- and 2-disilanylnaphthalenes (1979)
    Mitsuo Ishikawa, L. Fabry et al. Journal of the American Chemical Society

Citation Impact

Citing Papers

Electrografting: a powerful method for surface modification
2011 Standout
Aminodimethylalane (Me2AlNH2):  Matrix Isolation and ab Initio Calculations
1996
Triple Bonds to Silicon. Substituent Effects on the Thermodynamic and Kinetic Stabilities of Silynes Relative to Their Isomeric Silylidenes and Silavinylidenes
1997
Quantitation of Perchlorate Ion: Practices and Advances Applied to the Analysis of Common Matrices
2000
Rare earth elements: A review of applications, occurrence, exploration, analysis, recycling, and environmental impact
2019 Standout
State-of-the-art in inorganic mass spectrometry for analysis of high-purity materials
2003
π-Bonding and the Lone Pair Effect in Multiple Bonds Involving Heavier Main Group Elements: Developments in the New Millennium
2010 Standout
π-Bonding and the Lone Pair Effect in Multiple Bonds between Heavier Main Group Elements
1999 Standout
Multiple bonds to silicon: 20 years later
2002
Combined ellipsometry and X-ray related techniques for studies of ultrathin organic nanocomposite films
2010
Instrumentation for trace detection of high explosives
2004 Standout

Works of L. Fabry being referenced

Routine analysis of ultra pure water by ICP-MS in the low- and sub-ng/L level
2000
Multiply bonded silicon: matrix isolation and chemical trapping of products of pyrolysis and photolysis of triazidophenylsilane
1993
Novel methods of TXRF analysis for silicon wafer surface inspection
1999
Optimization of the electrokinetic sample introduction in capillary electrophoresis for the ultra trace determination of anions on silicon wafer surfaces
1997
Improvement of total reflection X-ray fluorescence analysis of low Z elements on silicon wafer surfaces at the PTB monochromator beamline for undulator radiation at the electron storage ring BESSY II
2001
Rankless by CCL
2026