L. Fabry

1.0k total citations
48 papers, 682 citations indexed

About

L. Fabry is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Radiation. According to data from OpenAlex, L. Fabry has authored 48 papers receiving a total of 682 indexed citations (citations by other indexed papers that have themselves been cited), including 18 papers in Surfaces, Coatings and Films, 18 papers in Electrical and Electronic Engineering and 17 papers in Radiation. Recurrent topics in L. Fabry's work include Electron and X-Ray Spectroscopy Techniques (18 papers), X-ray Spectroscopy and Fluorescence Analysis (17 papers) and Silicon and Solar Cell Technologies (12 papers). L. Fabry is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (18 papers), X-ray Spectroscopy and Fluorescence Analysis (17 papers) and Silicon and Solar Cell Technologies (12 papers). L. Fabry collaborates with scholars based in Germany, United States and Austria. L. Fabry's co-authors include S. Pahlke, L. Kotz, K.‐J. RANGE, P. Wobrauschek, Christina Streli, Peter Kregsamer, K. Bächmann, Burkhard Beckhoff, G. Ulm and G. Pepponi and has published in prestigious journals such as Journal of the American Chemical Society, Journal of The Electrochemical Society and Journal of Chromatography A.

In The Last Decade

L. Fabry

48 papers receiving 614 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
L. Fabry Germany 18 308 241 180 119 114 48 682
E. Bruninx Netherlands 10 126 0.4× 80 0.3× 68 0.4× 41 0.3× 77 0.7× 29 417
Joseph Fine United States 14 53 0.2× 138 0.6× 129 0.7× 46 0.4× 146 1.3× 32 509
G. G. B. de Souza Brazil 19 302 1.0× 109 0.5× 193 1.1× 23 0.2× 93 0.8× 66 1.0k
A. Scafati Italy 12 155 0.5× 118 0.5× 34 0.2× 27 0.2× 131 1.1× 25 584
Takafumi Kondoh Japan 15 78 0.3× 213 0.9× 21 0.1× 46 0.4× 44 0.4× 46 487
Jakob Heller Austria 12 64 0.2× 76 0.3× 100 0.6× 42 0.4× 120 1.1× 30 578
Martin Lundholm Sweden 9 32 0.1× 78 0.3× 83 0.5× 16 0.1× 116 1.0× 11 390
P. Bisgaard Denmark 9 73 0.2× 82 0.3× 39 0.2× 43 0.4× 82 0.7× 15 429
S. B. Gudennavar India 16 153 0.5× 32 0.1× 62 0.3× 83 0.7× 382 3.4× 67 841
P. Kelfve Sweden 9 193 0.6× 80 0.3× 204 1.1× 17 0.1× 144 1.3× 10 693

Countries citing papers authored by L. Fabry

Since Specialization
Citations

This map shows the geographic impact of L. Fabry's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L. Fabry with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L. Fabry more than expected).

Fields of papers citing papers by L. Fabry

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by L. Fabry. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L. Fabry. The network helps show where L. Fabry may publish in the future.

Co-authorship network of co-authors of L. Fabry

This figure shows the co-authorship network connecting the top 25 collaborators of L. Fabry. A scholar is included among the top collaborators of L. Fabry based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with L. Fabry. L. Fabry is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Streli, Christina, G. Pepponi, P. Wobrauschek, et al.. (2003). Analysis of low Z elements on Si wafer surfaces with synchrotron radiation induced total reflection X-ray fluorescence at SSRL, Beamline 3-3: comparison of droplets with spin coated wafers. Spectrochimica Acta Part B Atomic Spectroscopy. 58(12). 2105–2112. 14 indexed citations
2.
Fabry, L., et al.. (2003). Modification and validation of the pyromellitic acid electrolyte for the capillary electrophoretic determination of anions. Journal of Chromatography A. 995(1-2). 217–226. 9 indexed citations
3.
Streli, Christina, G. Pepponi, P. Wobrauschek, et al.. (2003). Analysis of low Z elements on Si wafer surfaces with undulator radiation induced total reflection X-ray fluorescence at the PTB beamline at BESSY II. Spectrochimica Acta Part B Atomic Spectroscopy. 58(12). 2113–2121. 18 indexed citations
4.
Pepponi, G., Burkhard Beckhoff, G. Ulm, et al.. (2003). Analysis of organic contaminants on Si wafers with TXRF-NEXAFS. Spectrochimica Acta Part B Atomic Spectroscopy. 58(12). 2245–2253. 23 indexed citations
5.
RANGE, K.‐J., et al.. (2002). Modeling of Cu gettering in p- and n-type silicon and in poly-silicon. Applied Physics A. 75(4). 525–534. 13 indexed citations
6.
RANGE, K.‐J., et al.. (2002). Comparison of different gettering techniques for Cu- p+ versus polysilicon and oxygen precipitates. Applied Physics A. 75(5). 591–595. 5 indexed citations
7.
8.
Fabry, L., et al.. (2001). Ultra-trace analytical monitoring of silicon wafer surfaces by capillary electrophoresis. Fresenius Journal of Analytical Chemistry. 371(4). 407–412. 4 indexed citations
9.
Beckhoff, Burkhard, R. Fliegauf, G. Ulm, et al.. (2001). Improvement of total reflection X-ray fluorescence analysis of low Z elements on silicon wafer surfaces at the PTB monochromator beamline for undulator radiation at the electron storage ring BESSY II. Spectrochimica Acta Part B Atomic Spectroscopy. 56(11). 2073–2083. 23 indexed citations
10.
Fabry, L., et al.. (2001). Enhancement of gettering efficiencies of different silicon substrates during a 0.18 μm LTB CMOS process simulation –. Microelectronic Engineering. 56(1-2). 153–156. 2 indexed citations
11.
RANGE, K.‐J., et al.. (2000). Gettering of Copper and Nickel in p/p+ Epitaxial Wafers. Journal of The Electrochemical Society. 147(7). 2704–2704. 25 indexed citations
12.
RANGE, K.‐J., et al.. (2000). Gettering efficiencies of polysilicon-, stacking fault- and He-implanted backsides for Cu and Ni. Materials Science and Engineering B. 73(1-3). 95–98. 20 indexed citations
13.
Fabry, L., et al.. (2000). Routine analysis of ultra pure water by ICP-MS in the low- and sub-ng/L level. Fresenius Journal of Analytical Chemistry. 366(1). 64–69. 8 indexed citations
14.
Streli, Christina, Peter Kregsamer, P. Wobrauschek, et al.. (1999). Low Z total reflection X-ray fluorescence analysis — challenges and answers. Spectrochimica Acta Part B Atomic Spectroscopy. 54(10). 1433–1441. 34 indexed citations
15.
RANGE, K.‐J., et al.. (1999). Calibrated Contamination Spiking Method for Silicon Wafers in the 1010 – 1012   Atom / cm2 Range. Journal of The Electrochemical Society. 146(6). 2245–2253. 14 indexed citations
16.
Wobrauschek, P., Peter Kregsamer, Christina Streli, et al.. (1997). Analysis of Ni on Si-wafer surfaces using synchrotron radiation excited total reflection X-ray fluorescence analysis. Spectrochimica Acta Part B Atomic Spectroscopy. 52(7). 901–906. 35 indexed citations
17.
Fabry, L., S. Pahlke, & L. Kotz. (1996). Accurate calibration of TXRF using microdroplet samples. Analytical and Bioanalytical Chemistry. 354(3). 266–270. 17 indexed citations
18.
Ishikawa, Mitsuo, L. Fabry, Makoto Kumada, et al.. (1979). Photochemically generated silicon-carbon double-bonded intermediates. 10. Photochemical behavior of 1-disilanyl- and 2-disilanylnaphthalenes. Journal of the American Chemical Society. 101(16). 4612–4618. 19 indexed citations
19.
Ishikawa, Mitsuo, Hiroshi Sugisawa, L. Fabry, & Makoto Kumada. (1978). Photolysis of organopolysilanes. Preparation and photolysis of silylphenylpropynes and silylphenylpropadienes. Journal of Organometallic Chemistry. 161(3). 299–311. 2 indexed citations
20.
Huff, Howard R., L. Fabry, & Seigô Kishino. (1977). Semiconductor silicon 1981 : proceedings of the fourth International Symposium on Silicon Materials Science and Technology. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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