J.P. Colinge

Nanowire transistors without junctions

Radiation-induced soft errors in advanced semiconductor technologies

Basic mechanisms and modeling of single-event upset in digital microelectronics

Single-event effects in SOI technologies and devices

In-memory computing with resistive switching devices

Analytical model for the high-temperature behaviour of the subthreshold slope in MuGFETs

Statistical Fluctuations in HfO_x Resistive-Switching Memory: Part II—Random Telegraph Noise

Dose radiation effects in FinFETs

Radiation Effects in MOS Oxides

Effects of total-dose irradiation on gate-all-around (GAA) devices

Intrinsic Advantages of SOI Multiple-Gate MOSFET (MuGFET) for Low Power Applications

Temporal analysis of SEU in SOI/GAA SRAMs

Random telegraph-signal noise in junctionless transistors

Radiation-hard design for SOI MOS inverters