Citation Impact
Citing Papers
Radiation-induced soft errors in advanced semiconductor technologies
2005 Standout
Basic mechanisms and modeling of single-event upset in digital microelectronics
2003 Standout
Radiation Effects in MOS Oxides
2008 Standout
Destructive single-event effects in semiconductor devices and ICs
2003
Works of E. Lorfèvre being referenced
Cell design modifications to harden an N-channel power IGBT against single event latchup
1999
SEU critical charge and sensitive area in a submicron CMOS technology
1997
SEGR and SEB in n-channel power MOSFETs
1996