Immediate Impact

4 standout
Sub-graph 1 of 2

Citing Papers

A novel fault diagnosis method based on CNN and LSTM and its application in fault diagnosis for complex systems
2021 Standout
A novel hybrid artificial intelligence approach for flood susceptibility assessment
2017 Standout
2 intermediate papers

Works of D. Bhattacharya being referenced

Integrated circuit testing for quality assurance in manufacturing: history, current status, and future trends
1997
Delay fault test generation for scan/hold circuits using Boolean expressions
1992

Author Peers

Author Last Decade Papers Cites
D. Bhattacharya 88 86 68 15 195
Utsav Patel 139 136 11 18 265
Peter A. Barrett 15 32 46 17 251
William T. Marshall 31 21 54 16 186
Ahmed Hallawa 35 28 11 18 160
R. H. Thomas 18 96 8 15 186
Suk Suk 92 109 22 15 165
William C. Carter 147 140 8 12 226
Nobuhiko Koike 33 38 10 13 123
Christopher Wilson 33 187 21 13 250
Runbin Shi 32 5 50 12 174

All Works

Loading papers...

Rankless by CCL
2026