Ch. Genzel

A GaN bulk crystal with improved structural quality grown by the ammonothermal method

High-throughput microwave-assisted discovery of new metal phosphonates

A three-dimensional X-ray diffraction microscope for deformation studies of polycrystals

Machining induced surface integrity in titanium and nickel alloys: A review

Assessing the Band Structure of CuInS₂ Nanocrystals and Their Bonding with the Capping Ligand

A review of Ga2O3 materials, processing, and devices

Overview of constitutive laws, kinematics, homogenization and multiscale methods in crystal plasticity finite-element modeling: Theory, experiments, applications

Crystal Structure and Ferroelectric Properties of ε-Ga₂O₃ Films Grown on (0001)-Sapphire

Template-directed proton conduction pathways in a coordination framework

Correlative imaging of ionic transport and electronic structure in nano Li_0.5FePO₄ electrodes

Depth-resolving structural analysis of GaN layers by skew angle x-ray diffraction

Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction

Analytical modelling of residual stresses in machining

Surface integrity in material removal processes: Recent advances

Residual Stress in PVD-Coated Carbide Cutting Inserts - Applications of the sin²ψ and the Scattering Vector Method

A self-consistent method for X-ray diffraction analysis of multiaxial residual-stress fields in the near-surface region of polycrystalline materials. II. Examples

Formalism for the evaluation of strongly non-linear surface stress fields by X-ray diffraction performed in the scattering vector mode

Evaluation of stress gradients ??ij(z) from their discrete laplace transforms ??ij(τk) obtained by x-ray diffraction performed in the scattered vector mode

Some new aspects in X-ray stress analysis of thin layers

In-situ studies of the recrystallization process of CuInS2 thin films by energy dispersive X-ray diffraction

Residual stress fields in surface-treated silicon carbide for space industry—comparison of biaxial and triaxial analysis using different X-ray methods

Stress measurements in thermal loaded (Ti,Al)N hard coatings

A new diffractometer for materials science and imaging at HASYLAB beamline G3

X-Ray Stress Gradient Analysis in Thin Layers — Problems and Attempts at Their Solution