Ch. Genzel

1.9k total citations
61 papers, 1.5k citations indexed

About

Ch. Genzel is a scholar working on Mechanical Engineering, Mechanics of Materials and Materials Chemistry. According to data from OpenAlex, Ch. Genzel has authored 61 papers receiving a total of 1.5k indexed citations (citations by other indexed papers that have themselves been cited), including 30 papers in Mechanical Engineering, 28 papers in Mechanics of Materials and 22 papers in Materials Chemistry. Recurrent topics in Ch. Genzel's work include Metal and Thin Film Mechanics (20 papers), Welding Techniques and Residual Stresses (14 papers) and Microstructure and Mechanical Properties of Steels (11 papers). Ch. Genzel is often cited by papers focused on Metal and Thin Film Mechanics (20 papers), Welding Techniques and Residual Stresses (14 papers) and Microstructure and Mechanical Properties of Steels (11 papers). Ch. Genzel collaborates with scholars based in Germany, France and Brazil. Ch. Genzel's co-authors include M. Klaus, W. Reimers, Ingwer A. Denks, Lothar Wagner, Emad Maawad, H.‐G. Brokmeier, Yuji Sano, Jens Gibmeier, H. Holzschuh and N. H. Nickel and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Acta Materialia.

In The Last Decade

Ch. Genzel

61 papers receiving 1.5k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Ch. Genzel Germany 22 905 806 609 299 222 61 1.5k
Peter Staron Germany 29 2.2k 2.4× 1.2k 1.5× 463 0.8× 79 0.3× 241 1.1× 153 2.7k
M. Klaus Germany 24 818 0.9× 1.2k 1.4× 441 0.7× 372 1.2× 147 0.7× 60 1.7k
J. M. Rigsbee United States 22 1.3k 1.4× 1.1k 1.3× 425 0.7× 154 0.5× 122 0.5× 76 1.8k
G. Ravichandran United States 16 1.2k 1.3× 1000 1.2× 526 0.9× 116 0.4× 213 1.0× 36 1.9k
Takahisa Shobu Japan 20 595 0.7× 612 0.8× 189 0.3× 93 0.3× 179 0.8× 163 1.2k
Dennis T. Quinto United States 20 438 0.5× 668 0.8× 755 1.2× 218 0.7× 138 0.6× 25 1.1k
C. J. Altstetter United States 29 2.0k 2.2× 2.3k 2.8× 679 1.1× 104 0.3× 98 0.4× 81 3.3k
S.K. Mishra India 23 1.1k 1.3× 1.1k 1.3× 588 1.0× 139 0.5× 86 0.4× 90 1.7k
Fan Lu China 21 662 0.7× 661 0.8× 524 0.9× 130 0.4× 202 0.9× 76 1.1k
Bernhard Sartory Austria 27 774 0.9× 1.6k 2.0× 1.7k 2.9× 435 1.5× 188 0.8× 83 2.3k

Countries citing papers authored by Ch. Genzel

Since Specialization
Citations

This map shows the geographic impact of Ch. Genzel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ch. Genzel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ch. Genzel more than expected).

Fields of papers citing papers by Ch. Genzel

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ch. Genzel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ch. Genzel. The network helps show where Ch. Genzel may publish in the future.

Co-authorship network of co-authors of Ch. Genzel

This figure shows the co-authorship network connecting the top 25 collaborators of Ch. Genzel. A scholar is included among the top collaborators of Ch. Genzel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ch. Genzel. Ch. Genzel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Droppa, R., et al.. (2016). Residual stress in nano-structured stainless steel (AISI 316L) prompted by Xe+ ion bombardment at different impinging angles. Journal of Applied Physics. 120(14). 3 indexed citations
3.
Meixner, M., M. Klaus, Ch. Genzel, & W. Reimers. (2013). Residual stress analysis of diamond-coated WC–Co cutting tools: separation of film and substrate information by grazing X-ray diffraction. Journal of Applied Crystallography. 46(5). 1323–1330. 9 indexed citations
4.
Meixner, M., M. Klaus, & Ch. Genzel. (2013). Sin2ψ-based residual stress gradient analysis by energy-dispersive synchrotron diffraction constrained by small gauge volumes. II. Experimental implementation. Journal of Applied Crystallography. 46(3). 619–627. 12 indexed citations
5.
García‐Moreno, Francisco, Catalina Jiménez, Paul H. Kamm, et al.. (2013). White-beam X-ray radioscopy and tomography with simultaneous diffraction at the EDDI beamline. Journal of Synchrotron Radiation. 20(5). 809–810. 16 indexed citations
6.
Meixner, M., M. Klaus, & Ch. Genzel. (2013). Sin2ψ-based residual stress gradient analysis by energy-dispersive synchrotron diffraction constrained by small gauge volumes. I. Theoretical concept. Journal of Applied Crystallography. 46(3). 610–618. 14 indexed citations
7.
Christiansen, Thomas L., et al.. (2012). Determination of composition, residual stress and stacking fault depth profiles in expanded austenite with energy-dispersive diffraction. Thin Solid Films. 530. 71–76. 24 indexed citations
8.
Brito, Pedro, Haroldo Cavalcanti Pinto, Ch. Genzel, M. Klaus, & Anke R. Kaysser-Pyzalla. (2011). Impact of transition oxides on growth stresses and texture of alumina scales formed during oxidation of iron aluminides. Scripta Materialia. 65(4). 312–315. 7 indexed citations
9.
Coelho, Rodrigo Santiago, M. Klaus, & Ch. Genzel. (2010). Through-thickness texture profiling by energy dispersive synchrotron diffraction. Journal of Applied Crystallography. 43(6). 1322–1328. 6 indexed citations
10.
Maawad, Emad, H.‐G. Brokmeier, M. Hofmann, Ch. Genzel, & Lothar Wagner. (2010). Stress distribution in mechanically surface treated Ti-2.5Cu determined by combining energy-dispersive synchrotron and neutron diffraction. Materials Science and Engineering A. 527(21-22). 5745–5749. 14 indexed citations
11.
Klaus, M., W. Reimers, & Ch. Genzel. (2009). Application of energy-dispersive diffraction to the analysis of highly inhomogeneous residual stress fields in thin film structures. Powder Diffraction. 24(S1). S82–S86. 14 indexed citations
12.
Genzel, Ch.. (2004). Diffraction Stress Analysis in Thin Films and Coatings—Problems, Methods and Perspectives. Journal of Neutron Research. 12(1-3). 233–241. 5 indexed citations
13.
Lengsfeld, Philipp, et al.. (2002). Raman spectroscopy of heavily doped polycrystalline and microcrystalline silicon. physica status solidi (b). 235(1). 170–178. 8 indexed citations
14.
Genzel, Ch., et al.. (2001). The application of white radiation to residual stress analysis in the intermediate zone between surface and volume. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 467-468. 1253–1256. 9 indexed citations
15.
Wroblewski, Thomas, et al.. (1999). A new diffractometer for materials science and imaging at HASYLAB beamline G3. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 428(2-3). 570–582. 48 indexed citations
16.
Genzel, Ch.. (1998). A Study of X-Ray Residual Stress Gradient Analysis in Thin Layers with Strong Fibre Texture. physica status solidi (a). 165(2). 347–360. 1 indexed citations
17.
Genzel, Ch., et al.. (1990). Shear Stress Distribution in Crystals Induced by Mechanical Surface Load. physica status solidi (a). 117(1). 141–154. 1 indexed citations
18.
Genzel, Ch., et al.. (1990). Structural perfection of Hg1−xCdxTe Grown by THM. Journal of Crystal Growth. 101(1-4). 232–236. 17 indexed citations
19.
Mühlberg, Manfred, et al.. (1990). Crystalline and chemical quality of CdTe and Cd1-xZnxTe grown by the Bridgman method in low temperature gradients. Journal of Crystal Growth. 101(1-4). 275–280. 52 indexed citations
20.
Rudolph, P., P. Gille, Ch. Genzel, & Torsten Boeck. (1984). Investigations of the process of crystal growth from a liquid zone by Seebeck measurements. Crystal Research and Technology. 19(8). 1073–1078. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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