Citation Impact
Citing Papers
Radiation-induced soft errors in advanced semiconductor technologies
2005 Standout
Basic mechanisms and modeling of single-event upset in digital microelectronics
2003 Standout
Comparisons of soft error rate for SRAMs in commercial SOI and bulk below the 130-nm technology node
2003
Various SEU conditions in SRAM studied by 3-D device simulation
2001
Contribution of SiO/sub 2/ in neutron-induced SEU in SRAMs
2003
Works of B. Sagnes being referenced
Study of basic mechanisms induced by an ionizing particle on simple structures
2000
Device simulation study of the SEU sensitivity of SRAMs to internal ion tracks generated by nuclear reactions
2001