A.P. Dorey

Collective Security or Collective Disaster?

VLSI Test Principles and Architectures: Design for Testability

Quantum-Limit Piezoresistance of n-Type Inversion Layers of Silicon and Germanium

Survey of Test Vector Compression Techniques

The low temperature strain sensitivity of MOS transistors

The Evolution of International Security Studies

Influence of uniaxial stress on quantum effects in Si inversion layers

Silicon in mechanical sensors

Electronic properties of two-dimensional systems

25th Anniversary Article: The Evolution of Electronic Skin (E‐Skin): A Brief History, Design Considerations, and Recent Progress

Frequency output piezoresistive pressure sensor

The effect of strain on MOS transistors

Electronics education— the next decade

Fault simulation and modelling of microelectromechanical systems