Immediate Impact

4 standout
Sub-graph 1 of 2

Citing Papers

Interfacial phase-change memory
2011 Standout
Total ionizing dose effects in MOS oxides and devices
2003 Standout
2 intermediate papers

Works of A. Tanabe being referenced

A 30-ns 64-Mb DRAM with built-in self-test and self-repair function
1992

Author Peers

Author Last Decade Papers Cites
A. Tanabe 175 2 35 33 15 179
G. Kitsukawa 159 29 26 14 163
T. Sakata 154 28 19 15 163
C.H. Kim 235 35 52 9 244
M. Elmasry 207 61 44 13 217
Y. Kawajiri 161 32 25 17 202
Nishath Verghese 264 3 42 47 15 274
Mikhail Popovich 154 6 15 24 11 164
Mehdi Saligane 170 4 31 52 14 189
Alan J. Drake 111 2 19 52 9 130
Georg Georgakos 168 26 44 16 171

All Works

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Rankless by CCL
2026