A. Michez

Effects of hydrogen motion on interface trap formation and annealing

Basic mechanisms and modeling of single-event upset in digital microelectronics

Total dose induced latch in short channel NMOS/SOI transistors

Effects of Water on the Aging and Radiation Response of MOS Devices

Total ionizing dose effects in MOS oxides and devices

Mechanisms of Enhanced Radiation-Induced Degradation Due to Excess Molecular Hydrogen in Bipolar Oxides

Total ionizing dose effects in bipolar devices and circuits

Characterization of enhanced low dose rate sensitivity (ELDRS) effects using Gated Lateral PNP transistor structures

Total Ionizing Dose Effects on Triple-Gate FETs

Dose-rate sensitivity of modern nMOSFETs

Worst-case bias during total dose irradiation of SOI transistors

Radiation Effects in MOS Oxides

Radiation effects in advanced microelectronics technologies

Two-dimensional simulation of total dose effects on NMOSFET with lateral parasitic transistor

Simulation of multi-level radiation-induced charge trapping and thermally activated phenomena in SiO/sub 2/

Physical model for enhanced interface-trap formation at low dose rates