Thin Films Stresses and Mechanical Properties VI
- Electronic, Optical and Magnetic Materials
- Mechanics of Materials
- Electrical and Electronic Engineering
In The Last Decade
doi.org/w55821971 →Countries where authors are citing Thin Films Stresses and Mechanical Properties VI
This map shows the geographic impact of Thin Films Stresses and Mechanical Properties VI. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thin Films Stresses and Mechanical Properties VI with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thin Films Stresses and Mechanical Properties VI more than expected).
Fields of papers citing Thin Films Stresses and Mechanical Properties VI
This network shows the impact of Thin Films Stresses and Mechanical Properties VI. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the Thin Films Stresses and Mechanical Properties VI.
About Thin Films Stresses and Mechanical Properties VI
This paper, published in 1996, received 438 indexed citations . Written by W. W. Gerberich, Han Gao, J.‐E. Sundgren and Shefford P. Baker covering the research area of Electronic, Optical and Magnetic Materials, Mechanics of Materials and Electrical and Electronic Engineering. It is primarily cited by scholars working on Mechanics of Materials (319 citations), Materials Chemistry (194 citations) and Electrical and Electronic Engineering (125 citations).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.
This paper is also available at doi.org/w55821971.