X-ray diffraction procedures for polycrystalline and amorphous materials
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doi.org/10.1021/ed032p228.2 →Countries where authors are citing X-ray diffraction procedures for polycrystalline and amorphous materials
This map shows the geographic impact of X-ray diffraction procedures for polycrystalline and amorphous materials. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by X-ray diffraction procedures for polycrystalline and amorphous materials with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites X-ray diffraction procedures for polycrystalline and amorphous materials more than expected).
Fields of papers citing X-ray diffraction procedures for polycrystalline and amorphous materials
This network shows the impact of X-ray diffraction procedures for polycrystalline and amorphous materials. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the X-ray diffraction procedures for polycrystalline and amorphous materials.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.
This paper is also available at doi.org/10.1021/ed032p228.2.