William M. Vetter
- Electrical and Electronic Engineering top 5%
- Atomic and Molecular Physics, and Optics top 10%
- Materials Chemistry
- Electronic, Optical and Magnetic Materials
- Organic Chemistry top 10%
- Co-authors
- Michael DudleyMarek SkowrońskiAyusman SenXianrong HuangWei HuangC. HallinEdward SanchezH. Lendenmann
- Topics
- Silicon Carbide Semiconductor Technologies (46 papers)Silicon and Solar Cell Technologies (20 papers)Thin-Film Transistor Technologies (18 papers)
- Cited by
- Ceramics and CompositesElectrical and Electronic EngineeringProcess Chemistry and Technology
- Partner nations
- United StatesSwedenJapan
In The Last Decade
William M. Vetter
58 papers receiving 1.1k citations
Peers
Comparison fields: 5 of 52
- Electrical and Electronic Engineering 800
- Atomic and Molecular Physics, and Optics 220
- Materials Chemistry 198
- Electronic, Optical and Magnetic Materials 160
- Organic Chemistry 154
Countries citing papers authored by William M. Vetter
This map shows the geographic impact of William M. Vetter's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by William M. Vetter with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites William M. Vetter more than expected).
Fields of papers citing papers by William M. Vetter
This network shows the impact of papers produced by William M. Vetter. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by William M. Vetter. The network helps show where William M. Vetter may publish in the future.
Co-authorship network of co-authors of William M. Vetter
This figure shows the co-authorship network connecting the top 25 collaborators of William M. Vetter. A scholar is included among the top collaborators of William M. Vetter based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with William M. Vetter. William M. Vetter is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 3 | |
| 2 | 12 | |
| 3 | 1 | |
| 4 | 1 | |
| 5 | 15 | |
| 6 | 1 | |
| 7 | 7 | |
| 8 | 15 | |
| 9 | 13 | |
| 10 | 4 | |
| 11 | 3 | |
| 12 | 2 | |
| 13 | 10 | |
| 14 | 4 | |
| 15 | Characterization of dislocation structures in silicon carbide single crystals | 1 |
| 16 | 8 | |
| 17 | 3 | |
| 18 | 31 | |
| 19 | 20 | |
| 20 | 63 |
About William M. Vetter
William M. Vetter is a scholar working on Ceramics and Composites, Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics, having authored 59 papers that have together received 1.1k indexed citations. Recurring topics across this work include Silicon Carbide Semiconductor Technologies (46 papers), Silicon and Solar Cell Technologies (20 papers) and Thin-Film Transistor Technologies (18 papers). The work is most often cited by research in Ceramics and Composites (112 citations), Electrical and Electronic Engineering (800 citations) and Process Chemistry and Technology (33 citations). William M. Vetter has collaborated with scholars based in United States, Sweden and Japan. Frequent co-authors include Michael Dudley, Marek Skowroński, Ayusman Sen, Xianrong Huang, Wei Huang, C. Hallin, Edward Sanchez, H. Lendenmann, Jwu Ting Chen and Robert R. Whittle. Their work appears in journals such as Journal of the American Chemical Society, Applied Physics Letters and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.